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  1. 2024

  2. Electron and hole bipolar injection in magnesium oxide films

    Perevalov, T. V., Islamov, D. R., Zalyalov, T. M., Gismatulin, A. A., Golyashov, V. A., Tereshchenko, O. E., Gorshkov, D. V. & Gritsenko, V. A., 6 Feb 2024, In: Applied Physics Letters. 124, 4, 042903.

    Research output: Contribution to journal › Article › peer-review

  3. Impact of lanthanum doping on the electronic structure of oxygen vacancies in hafnium oxide

    Perevalov, T. V. & Islamov, D. R., 30 Jan 2024, In: Computational Materials Science. 233, 5 p., 112708.

    Research output: Contribution to journal › Article › peer-review

  4. 2023

  5. Mechanism of Transverse Charge Transfer in Thin Films of Hexagonal Boron Nitride

    Islamov, D. R., Perevalov, T. V., Gismatulin, A. A., Azarov, I. A., Spesivtsev, E. V. & Gritsenko, V. A., Mar 2023, In: Journal of Experimental and Theoretical Physics. 136, 3, p. 345-352 8 p.

    Research output: Contribution to journal › Article › peer-review

  6. CPU vs RAM in the Issue of ab initio Simulations of Doped Hafnium Oxide for RRAM and FRAM

    Perevalov, T. V. & Islamov, D. R., 2023, In: Supercomputing Frontiers and Innovations. 10, 3, p. 18-26 9 p.

    Research output: Contribution to journal › Article › peer-review

  7. 2022

  8. Optimal Structure of Lanthanum-Doped Hafnium Oxide: First-Principle Modeling

    Kovzik, V. M., Perevalov, T. V. & Islamov, D. R., 2022, Proceedings of the 2022 IEEE 23rd International Conference of Young Professionals in Electron Devices and Materials, EDM 2022. IEEE Computer Society, p. 11-14 4 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM; vol. 2022-June).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  9. 2021

  10. Exact statistical solution for the hopping transport of trapped charge via finite Markov jump processes

    Pil’nik, A. A., Chernov, A. A. & Islamov, D. R., 13 May 2021, In: Scientific Reports. 11, 1, p. 10163 10163.

    Research output: Contribution to journal › Article › peer-review

  11. Influence of the active TaN/ZrOx/Ni memristor layer oxygen content on forming and resistive switching behavior

    Voronkovskii, V. A., Aliev, V. S., Gerasimova, A. K., Perevalov, T. V., Prosvirin, I. P. & Islamov, D. R., 30 Apr 2021, In: Nanotechnology. 32, 18, 185205.

    Research output: Contribution to journal › Article › peer-review

  12. Oxygen vacancies in zirconium oxide as the blue luminescence centres and traps responsible for charge transport: Part I—Crystals

    Islamov, D. R., Gritsenko, V. A., Perevalov, T. V., Yelisseyev, A. P., Pustovarov, V. A., Korolkov, I. V. & Lomonova, E. E., Mar 2021, In: Materialia. 15, 100979.

    Research output: Contribution to journal › Article › peer-review

  13. Oxygen vacancies in zirconium oxide as the blue luminescence centres and traps responsible for charge transport: Part II—Films

    Islamov, D. R., Gritsenko, V. A., Perevalov, T. V., Aliev, V. S., Nadolinny, V. A. & Chin, A., Mar 2021, In: Materialia. 15, 100980.

    Research output: Contribution to journal › Article › peer-review

  14. 2020

  15. Charge transport mechanism in dielectrics: drift and diffusion of trapped charge carriers

    Pil’nik, A. A., Chernov, A. A. & Islamov, D. R., 1 Dec 2020, In: Scientific Reports. 10, 1, 10 p., 15759.

    Research output: Contribution to journal › Article › peer-review

  16. Impact of oxygen vacancy on the ferroelectric properties of lanthanum-doped hafnium oxide

    Islamov, D. R., Zalyalov, T. M., Orlov, O. M., Gritsenko, V. A. & Krasnikov, G. Y., 19 Oct 2020, In: Applied Physics Letters. 117, 16, 5 p., 162901.

    Research output: Contribution to journal › Article › peer-review

  17. 2019

  18. Atomic and electronic structures of the native defects responsible for the resistive effect in HfO2: ab initio simulations

    Perevalov, T. V. & Islamov, D. R., 15 Aug 2019, In: Microelectronic Engineering. 216, 5 p., 111038.

    Research output: Contribution to journal › Article › peer-review

  19. Effect of oxygen vacancies on the ferroelectric Hf0.5Zr0.5O2 stabilization: DFT simulation

    Islamov, D. R. & Perevalov, T. V., 15 Aug 2019, In: Microelectronic Engineering. 216, 4 p., 111041.

    Research output: Contribution to journal › Article › peer-review

  20. Conduction mechanisms of TaN/HfO x /Ni memristors

    Voronkovskii, V. A., Aliev, V. S., Gerasimova, A. K. & Islamov, D. R., 5 Apr 2019, In: Materials Research Express. 6, 7, 7 p., 076411.

    Research output: Contribution to journal › Article › peer-review

  21. Identification of the nature of traps involved in the field cycling of Hf0.5Zr0.5O2-based ferroelectric thin films

    Islamov, D. R., Gritsenko, V. A., Perevalov, T. V., Pustovarov, V. A., Orlov, O. M., Chernikova, A. G., Markeev, A. M., Slesazeck, S., Schroeder, U., Mikolajick, T. & Krasnikov, G. Y., 1 Mar 2019, In: Acta Materialia. 166, p. 47-55 9 p.

    Research output: Contribution to journal › Article › peer-review

  22. В поисках универсальной памяти

    Исламов, Д. Р., 2019, Сборник тезисов, материалы Двадцать пятой Всероссийской научной конференции студентов-физиков и молодых ученых (ВНКСФ-25, Крым). Екатеринбург: Издательство АСФ России, p. 139-141 3 p.

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  23. Выявление корреляции между концентрациями нейтральных и заряженных ловушек в тонких пленках оксида гафния

    Залялов, Т. М. & Исламов, Д. Р., 2019, Сборник тезисов, материалы Двадцать пятой Всероссийской научной конференции студентов-физиков и молодых ученых (ВНКСФ-25, Крым). Екатеринбург: Издательство АСФ России, p. 136-137 2 p.

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  24. 2018

  25. The Evolution of the Conductivity and Cathodoluminescence of the Films of Hafnium Oxide in the Case of a Change in the Concentration of Oxygen Vacancies

    Islamov, D. R., Gritsenko, V. A., Kruchinin, V. N., Ivanova, E. V., Zamoryanskaya, M. V. & Lebedev, M. S., 1 Oct 2018, In: Physics of the Solid State. 60, 10, p. 2050-2057 8 p.

    Research output: Contribution to journal › Article › peer-review

  26. Atomic and Electronic Structures of Intrinsic Defects in Ta2O5: Ab Initio Simulation

    Perevalov, T. V., Islamov, D. R. & Chernykh, I. G., 1 Jun 2018, In: JETP Letters. 107, 12, p. 761-765 5 p.

    Research output: Contribution to journal › Article › peer-review

  27. Electronic structure of stoichiometric and oxygen-deficient ferroelectric Hf0.5Zr0.5O2

    Perevalov, T. V., Islamov, D. R., Gritsenko, V. A. & Prosvirin, I. P., 11 May 2018, In: Nanotechnology. 29, 19, 8 p., 194001.

    Research output: Contribution to journal › Article › peer-review

  28. Electronic Structure of Oxygen Vacancies in the Orthorhombic Noncentrosymmetric Phase Hf0.5Zr0.5O2

    Perevalov, T. V., Gritsenko, V. A., Islamov, D. R. & Prosvirin, I. P., 1 Jan 2018, In: JETP Letters. 107, 1, p. 55-60 6 p.

    Research output: Contribution to journal › Article › peer-review

  29. 2017

  30. Leakage currents mechanism in thin films of ferroelectric Hf0.5Zr0.5O2

    Islamov, D. R., Chernikova, A. G., Kozodaev, M. G., Markeev, A. M., Perevalov, T. V., Gritsenko, V. A. & Orlov, O. M., 15 Aug 2017, In: Journal of Physics: Conference Series. 864, 1, 4 p., 012002.

    Research output: Contribution to journal › Conference article › peer-review

  31. Mechanism of charge transport of stress induced leakage current and trap nature in thermal oxide on silicon

    Islamov, D. R., Gritsenko, V. A., Perevalov, T. V., Orlov, O. M. & Krasnikov, G. Y., 15 Aug 2017, In: Journal of Physics: Conference Series. 864, 1, 4 p., 012003.

    Research output: Contribution to journal › Conference article › peer-review

  32. Oxygen polyvacancy in anatas as a filament: First principle investigation

    Perevalov, T. V. & Islamov, D. R., 15 Aug 2017, In: Journal of Physics: Conference Series. 864, 1, 4 p., 012084.

    Research output: Contribution to journal › Conference article › peer-review

  33. Atomic and electronic structure of oxygen polyvacancies in ZrO2

    Perevalov, T. V. & Islamov, D. R., 25 Jun 2017, In: Microelectronic Engineering. 178, p. 275-278 4 p.

    Research output: Contribution to journal › Article › peer-review

  34. Determination of trap density in hafnia films produced by two atomic layer deposition techniques

    Islamov, D. R., Gritsenko, V. A. & Lebedev, M. S., 25 Jun 2017, In: Microelectronic Engineering. 178, p. 104-107 4 p.

    Research output: Contribution to journal › Article › peer-review

  35. Charge transport in thin hafnium and zirconium oxide films

    Islamov, D. R., Gritsenko, V. A. & Chin, A., 1 Mar 2017, In: Optoelectronics, Instrumentation and Data Processing. 53, 2, p. 184-189 6 p.

    Research output: Contribution to journal › Article › peer-review

  36. Determination of trap density in hafnium oxide films produced by different atomic layer deposition techniques

    Islamov, D. R., Gritsenko, V. A. & Lebedev, M. S., 1 Jan 2017, SEMICONDUCTORS, DIELECTRICS, AND METALS FOR NANOELECTRONICS 15: IN MEMORY OF SAMARES KAR. Misra, D., DeGendt, S., Houssa, M., Kita, K. & Landheer, D. (eds.). 1 ed. Electrochemical Society, Inc., Vol. 80. p. 265-270 6 p. (ECS Transactions; vol. 80).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  37. Oxygen polyvacancies as conductive filament in zirconia: First principle simulation

    Perevalov, T. V. & Islamov, D. R., 1 Jan 2017, SEMICONDUCTORS, DIELECTRICS, AND METALS FOR NANOELECTRONICS 15: IN MEMORY OF SAMARES KAR. Misra, D., DeGendt, S., Houssa, M., Kita, K. & Landheer, D. (eds.). 1 ed. Electrochemical Society, Inc., Vol. 80. p. 357-362 6 p. (ECS Transactions; vol. 80).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  38. The charge trap density evolution in wake-up and fatigue modes of FRAM

    Islamov, D. R., Orlov, O. M., Gritsenko, V. A. & Krasnikov, G. J., 1 Jan 2017, SEMICONDUCTORS, DIELECTRICS, AND METALS FOR NANOELECTRONICS 15: IN MEMORY OF SAMARES KAR. Misra, D., DeGendt, S., Houssa, M., Kita, K. & Landheer, D. (eds.). 1 ed. Electrochemical Society, Inc., Vol. 80. p. 279-281 3 p. (ECS Transactions; vol. 80).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  39. The Nature of Defects Responsible for Transport in a Hafnia-Based Resistive Random Access Memory Element

    Islamov, D. R., Perevalov, T. V., Gritsenko, V. A., Aliev, V. S., Saraev, A. A., Kaichev, V. V., Ivanova, E. V., Zamoryanskaya, M. V. & Chin, A., 1 Jan 2017, Advances in Semiconductor Nanostructures: Growth, Characterization, Properties and Applications. Latyshev, AV., Dvurechenskii, AV. & Aseev, AL. (eds.). Elsevier Science Publishing Company, Inc., p. 493-504 12 p.

    Research output: Chapter in Book/Report/Conference proceeding › Chapter › Research › peer-review

  40. 2016

  41. Three-dimensional non-linear complex model of dynamic memristor switching

    Chernov, A. A., Islamov, D. R., Pik'nik, A. A., Perevalov, T. V. & Gritsenko, V. A., 1 Jan 2016, NONVOLATILE MEMORIES 5. Karim, Z., Kobayashi, K., Shima, H., Bersuker, G., Shingubara, S., Saito, Y., Park, J. G., Magyari-Kope, B., Kubota, H. & Goux, L. (eds.). 32 ed. Electrochemical society, p. 95-104 10 p. (ECS Transactions; vol. 75, no. 32).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

ID: 3435182