Original languageEnglish
Pages (from-to)275-278
Number of pages4
JournalMicroelectronic Engineering
Volume178
DOIs
Publication statusPublished - 25 Jun 2017

    OECD FOS+WOS

    Research areas

  • Defect states, Density functional theory, Localization, Oxygen vacancy, Polyvacancy, Zirconia, DEFECTS, ZIRCONIA

ID: 10187822