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  1. 2024

  2. Surface morphology analysis of CdTe buffer layers using ellipsometry and interference profilometry to create a technique for monitoring the growth of buffer layers

    Shvets, V. A., Marin, D. V., Kuznetsova, L. S., Azarov, I. A., Yakushev, M. V. & Rykhlitskii, S. V., 20 Jul 2024, In: Journal of Optical Technology (A Translation of Opticheskii Zhurnal). 91, 2, p. 91-95 5 p., 6.

    Research output: Contribution to journal › Article › peer-review

  3. Temperature Dependence of the Spectra of Optical Constants of CdTe in the Region of the Absorption Edge

    Shvets, V. A., Marin, D. V., Yakushev, M. V. & Rykhiitskii, S. V., Apr 2024, In: Optics and Spectroscopy. 132, 4, p. 403-408 6 p.

    Research output: Contribution to journal › Article › peer-review

  4. In situ Ellipsometric Control of Growth Processes of ZnTe and CdTe Buffer Layers in Technology of Molecular Beam Epitaxy of Mercury Cadmium Telluride

    Shvets, V. A., Marin, D. V., Yakushev, M. V. & Rykhlitskii, S. V., Jan 2024, In: Semiconductors. 58, 1, p. 67-72 6 p.

    Research output: Contribution to journal › Article › peer-review

  5. 2023

  6. Energy Position of the Size Quantization Levels in Multiple HgCdTe Quantum Wells

    Mikhailov, N. N., Remesnik, V. G., Aleshkin, V. Y., Dvoretsky, S. A., Uzhakov, I. N. & Shvets, V. A., Jun 2023, In: Bulletin of the Russian Academy of Sciences: Physics. 87, 6, p. 755-759 5 p.

    Research output: Contribution to journal › Article › peer-review

  7. 2022

  8. In situ spectroscopic ellipsometry for temperature control in molecular beam epitaxy of HgCdTe

    Shvets, V. A., Marin, D. V., Azarov, I. A., Yakushev, M. V. & Rykhlitskii, S. V., 1 Dec 2022, In: Journal of Crystal Growth. 599, 126898.

    Research output: Contribution to journal › Article › peer-review

  9. 2021

  10. Ellipsometric In Situ Methods of Temperature Control in the Technology of Growing MBE MCT Layers

    Shvets, V. A., Marin, D. V., Azarov, I. A., Yakushev, M. V. & Rykhlitskii, S. V., Sept 2021, In: Optoelectronics, Instrumentation and Data Processing. 57, 5, p. 476-484 9 p., 5.

    Research output: Contribution to journal › Article › peer-review

  11. Ellipsometric thermometry in molecular beam epitaxy of mercury cadmium telluride

    Marin, D. V., Shvets, V. A., Azarov, I. A., Yakushev, M. V. & Rykhlitskii, S. V., Aug 2021, In: Infrared Physics and Technology. 116, 103793.

    Research output: Contribution to journal › Article › peer-review

  12. Investigation of the Temperature Dependence of the Spectra of Optical Constants of Hg1 –xCdхTe Films Grown Using Molecular Beam Epitaxy

    Shvets, V. A., Marin, D. V., Yakushev, M. V. & Rykhlitskii, S. V., Jan 2021, In: Optics and Spectroscopy. 129, 1, p. 29-36 8 p.

    Research output: Contribution to journal › Article › peer-review

  13. 2020

  14. Parametric Model of the Optical Constant Spectra of Hg1 –xCdxTe and Determination of the Compound Composition

    Shvets, V. A., Marin, D. V., Remesnik, V. G., Azarov, I. A., Yakushev, M. V. & Rykhlitskii, S. V., Dec 2020, In: Optics and Spectroscopy. 128, 12, p. 1948-1953 6 p.

    Research output: Contribution to journal › Article › peer-review

  15. Interface Studies in HgTe/HgCdTe Quantum Wells

    Mikhailov, N., Shvets, V., Ikusov, D., Uzhakov, I., Dvoretsky, S., Mynbaev, K., Dluzewski, P., Morgiel, J., Swiatek, Z., Bonchyk, O. & Izhnin, I., 1 May 2020, In: Physica Status Solidi (B) Basic Research. 257, 5, 5 p., 1900598.

    Research output: Contribution to journal › Article › peer-review

  16. A Mask Based on a Si Epitaxial Layer for the Self-Catalytic Nanowire Growth on GaAs(111)B and GaAs(100) Substrates

    Emelyanov, E. A., Nastovjak, A. G., Petrushkov, M. O., Esin, M. Y., Gavrilova, T. A., Putyato, M. A., Schwartz, N. L., Shvets, V. A., Vasev, A. V., Semyagin, B. R. & Preobrazhenskii, V. V., 1 Feb 2020, In: Technical Physics Letters. 46, 2, p. 161-164 4 p.

    Research output: Contribution to journal › Article › peer-review

  17. 2019

  18. MBE-grown MCT hetero- A nd nanostructures for IR and THz detectors

    Dvoretsky, S. A., Mikhailov, N. N., Remesnik, V. G., Sidorov, Y. G., Shvets, V. A., Ikusov, D. G., Varavin, V. S., Yakushev, M. V., Gumenjuk-Sichevska, J. V., Golenkov, A. G., Lysiuk, I. O., Tsybrii, Z. F., Shevchik-Shekera, A. V., Sizov, F. F., Latyshev, A. V. & Aseev, A. L., 1 Sept 2019, In: Opto-electronics Review. 27, 3, p. 282-290 9 p.

    Research output: Contribution to journal › Article › peer-review

  19. Determining the Compositional Profile of HgTe/Cd xHg1 – xTe Quantum Wells by Single-Wavelength Ellipsometry

    Shvets, V. A., Mikhailov, N. N., Ikusov, D. G., Uzhakov, I. N. & Dvoretskii, S. A., 1 Aug 2019, In: Optics and Spectroscopy. 127, 2, p. 340-346 7 p.

    Research output: Contribution to journal › Article › peer-review

  20. An Ellipsometric Technique with an ATR Module and a Monochromatic Source of Radiation for Measurement of Optical Constants of Liquids in the Terahertz Range

    Azarov, I. A., Choporova, Y. Y., Shvets, V. A. & Knyazev, B. A., 1 Feb 2019, In: Journal of Infrared, Millimeter, and Terahertz Waves. 40, 2, p. 200-209 10 p.

    Research output: Contribution to journal › Article › peer-review

  21. Ellipsometric Method for Measuring the CdTe Buffer-Layer Temperature in the Molecular-Beam Epitaxy of CdHgTe

    Shvets, V. A., Azarov, I. A., Marin, D. V., Yakushev, M. V. & Rykhlitsky, S. V., 1 Jan 2019, In: Semiconductors. 53, 1, p. 132-137 6 p.

    Research output: Contribution to journal › Article › peer-review

  22. Ellipsometric Method of Substrate Temperature Measurement in Low-Temperature Processes of Epitaxy of InSb Layers

    Shvets, V. A., Azarov, I. A., Rykhlitskii, S. V. & Toropov, A. I., 1 Jan 2019, In: Optoelectronics, Instrumentation and Data Processing. 55, 1, p. 8-15 8 p.

    Research output: Contribution to journal › Article › peer-review

  23. 2018

  24. Recent experiments at NovoFEL user stations

    Knyazev, B. A., Azarov, I. A., Chesnokov, E. N., Choporova, Y. Y., Gerasimov, V. V., Gorbachev, Y. I., Getmanov, Y. V., Goldenberg, B. G., Kameshkov, O. E., Koshlyakov, P. V., Kotelnikov, I. A., Kozlov, A. S., Kubarev, V. V., Kulipanov, G. N., Malyshkin, S. B., Nikitin, A. K., Nikitin, P. A., Osintseva, N. D., Pavelyev, V. S., Peltek, S. E., & 14 othersPetrov, A. K., Popik, V. M., Salikova, T. V., Scheglov, M. A., Seredniakov, S. S., Shastin, V. N., Shevchenko, O. A., Shvets, V. A., Skorokhod, D. A., Skrinsky, A. N., Veber, S. L., Vinokurov, N. A., Voloshinov, V. B. & Zhukavin, R. K., 23 Nov 2018, In: EPJ Web of Conferences. 195, 00002.

    Research output: Contribution to journal › Conference article › peer-review

  25. 2017

  26. Dispersion of the refractive index in high-k dielectrics

    Shvets, V. A., Kruchinin, V. N. & Gritsenko, V. A., 1 Nov 2017, In: Optics and Spectroscopy (English translation of Optika i Spektroskopiya). 123, 5, p. 728-732 5 p.

    Research output: Contribution to journal › Article › peer-review

  27. Dynamics of Growth of the Native Oxide of Cd xHg1−xTe

    Sidorov, G. Y., Shvets, V. A., Sidorov, Y. G. & Varavin, V. S., 1 Nov 2017, In: Optoelectronics, Instrumentation and Data Processing. 53, 6, p. 617-624 8 p.

    Research output: Contribution to journal › Article › peer-review

  28. Polarization Pyrometry of Layered Semiconductor Structures under Conditions of Low-Temperature Technological Processes

    Azarov, I. A., Shvets, V. A., Dulin, S. A., Mikhailov, N. N., Dvoretskii, S. A., Ikusov, D. G., Uzhakov, I. N. & Rykhlitskii, S. V., 1 Nov 2017, In: Optoelectronics, Instrumentation and Data Processing. 53, 6, p. 630-638 9 p.

    Research output: Contribution to journal › Article › peer-review

ID: 3456539