Translated title of the contributionЭллипсометрические in situ методы контроля температуры в технологии выращивания слоёв МЛЭ КРТ
Original languageEnglish
Article number5
Pages (from-to)476-484
Number of pages9
JournalOptoelectronics, Instrumentation and Data Processing
Volume57
Issue number5
DOIs
Publication statusPublished - Sept 2021

    OECD FOS+WOS

  • 2.02 ELECTRICAL ENG, ELECTRONIC ENG
  • 1.03 PHYSICAL SCIENCES AND ASTRONOMY

    Research areas

  • ellipsometry, growth temperature, mercury cadmium telluride, molecular beam epitaxy, process control

ID: 35771128