DOI

  • Nikolay Mikhailov
  • Vasiliy Shvets
  • Danil Ikusov
  • Ivan Uzhakov
  • Sergey Dvoretsky
  • Karim Mynbaev
  • Piotr Dluzewski
  • Jerzy Morgiel
  • Zbigniew Swiatek
  • Olexander Bonchyk
  • Ihor Izhnin
Original languageEnglish
Article number1900598
Number of pages5
JournalPhysica Status Solidi (B) Basic Research
Volume257
Issue number5
DOIs
Publication statusPublished - 1 May 2020

    Research areas

  • composition profiles, ellipsometry, HgTe/HgCdTe quantum wells, interfaces, transmission electron microscopy, HgTe, HgCdTe quantum wells, DAMAGE

    OECD FOS+WOS

ID: 23543246