Determining the Compositional Profile of HgTe/Cd xHg1 – xTe Quantum Wells by Single-Wavelength Ellipsometry › Research Explorer

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Determining the Compositional Profile of HgTe/Cd_xHg_1 – _xTe Quantum Wells by Single-Wavelength Ellipsometry

Research output: Contribution to journal › Article › peer-review

DOI

https://doi.org/10.1134/S0030400X19080253
Final published version

V. A. Shvets
N. N. Mikhailov
D. G. Ikusov
I. N. Uzhakov
S. A. Dvoretskii

Original language	English
Pages (from-to)	340-346
Number of pages	7
Journal	Optics and Spectroscopy
Volume	127
Issue number	2
DOIs	https://doi.org/10.1134/S0030400X19080253
Publication status	Published - 1 Aug 2019

OECD FOS+WOS

Research areas

compositional profile, ellipsometric parameters, molecular beam epitaxy

ID: 21856045