• E. A. Emelyanov
  • A. G. Nastovjak
  • M. O. Petrushkov
  • M. Yu Esin
  • T. A. Gavrilova
  • M. A. Putyato
  • N. L. Schwartz
  • V. A. Shvets
  • A. V. Vasev
  • B. R. Semyagin
  • V. V. Preobrazhenskii
Original languageEnglish
Pages (from-to)161-164
Number of pages4
JournalTechnical Physics Letters
Volume46
Issue number2
DOIs
Publication statusPublished - 1 Feb 2020

    Research areas

  • atomic force microscopy, ellipsometry, molecular beam epitaxy, nanowires, scanning electronic microscopy, GAAS NANOWIRES

    OECD FOS+WOS

  • 1.03 PHYSICAL SCIENCES AND ASTRONOMY

ID: 24161963