• ???ru_RU???
Novosibirsk State University's Research Portal
Search
  • Frontpage
  • Research output
  • Staff
  • Activities
  • Prizes
  • Projects
  • Research units
  • Equipment
  • Press/Media
  • About
Василий Александрович Швец
Василий Александрович Швец

Shvets, Vasiliy Aleksandrovich

(Former)

  • Overview
  • Research output

Research output

  1. Surface morphology analysis of CdTe buffer layers using ellipsometry and interference profilometry to create a technique for monitoring the growth of buffer layers

    Research output: Contribution to journal › Article › peer-review

  2. Temperature Dependence of the Spectra of Optical Constants of CdTe in the Region of the Absorption Edge

    Research output: Contribution to journal › Article › peer-review

  3. In situ Ellipsometric Control of Growth Processes of ZnTe and CdTe Buffer Layers in Technology of Molecular Beam Epitaxy of Mercury Cadmium Telluride

    Research output: Contribution to journal › Article › peer-review

View all (20) »

ID: 3456539

Novosibirsk State University's Research Portal
Unless explicitly stated otherwise, all material is copyright © Novosibirsk State University 2017-2023.
Pure is an Elsevier product
Log in to Pure