1. Atomic Force Microscopy Local Oxidation of GeO Thin Films

    Astankova, K. N., Kozhukhov, A. S., Gorokhov, E. B., Azarov, I. A. & Latyshev, A. V., 1 Dec 2018, In: Semiconductors. 52, 16, p. 2081-2084 4 p.

    Research output: Contribution to journalArticlepeer-review

  2. Characterization of Structure, Morphology, Optical and Electrical Properties of AlN–Al–V Multilayer Thin Films Fabricated by Reactive DC Magnetron Sputtering

    Миронова, М. И., Капишников, А. В., Хамуд, Г., Володин, В. А., Азаров, И. А., Юшков, И. Д., Камаев, Г. Н., Супрун, Е., Chirikov, N., Davletkildeev, N. A., Baidakov, A. N., Kovivchak, V. S., Baranova, L. V., Струнин, В. И. & Гейдт, П. В., Feb 2023, In: Coatings. 13, 2, 223.

    Research output: Contribution to journalArticlepeer-review

  3. Determination of the infrared absorption cross-section of the stretching vibrations of Ge–O bonds in GeOx films

    Zhang, F., Volodin, V. A., Astankova, K. N., Kamaev, G. N., Azarov, I. A., Prosvirin, I. P. & Vergnat, M., Jan 2022, In: Results in Chemistry. 4, 100461.

    Research output: Contribution to journalArticlepeer-review

  4. Effect of annealing temperature on the morphology, structure, and optical properties of nanostructured SnO(x) films

    Timofeev, V. A., Mashanov, V. I., Nikiforov, A. I., Azarov, I. A., Loshkarev, I. D., Korolkov, I. V., Gavrilova, T. A., Yesin, M. Y. & Chetyrin, I. A., 6 Jan 2020, In: Materials Research Express. 7, 1, 9 p., 015027.

    Research output: Contribution to journalArticlepeer-review

  5. Ellipsometric In Situ Methods of Temperature Control in the Technology of Growing MBE MCT Layers

    Shvets, V. A., Marin, D. V., Azarov, I. A., Yakushev, M. V. & Rykhlitskii, S. V., Sept 2021, In: Optoelectronics, Instrumentation and Data Processing. 57, 5, p. 476-484 9 p., 5.

    Research output: Contribution to journalArticlepeer-review

  6. Ellipsometric Method for Measuring the CdTe Buffer-Layer Temperature in the Molecular-Beam Epitaxy of CdHgTe

    Shvets, V. A., Azarov, I. A., Marin, D. V., Yakushev, M. V. & Rykhlitsky, S. V., 1 Jan 2019, In: Semiconductors. 53, 1, p. 132-137 6 p.

    Research output: Contribution to journalArticlepeer-review

  7. Ellipsometric Method of Substrate Temperature Measurement in Low-Temperature Processes of Epitaxy of InSb Layers

    Shvets, V. A., Azarov, I. A., Rykhlitskii, S. V. & Toropov, A. I., 1 Jan 2019, In: Optoelectronics, Instrumentation and Data Processing. 55, 1, p. 8-15 8 p.

    Research output: Contribution to journalArticlepeer-review

  8. Ellipsometric thermometry in molecular beam epitaxy of mercury cadmium telluride

    Marin, D. V., Shvets, V. A., Azarov, I. A., Yakushev, M. V. & Rykhlitskii, S. V., Aug 2021, In: Infrared Physics and Technology. 116, 103793.

    Research output: Contribution to journalArticlepeer-review

  9. Evaluation of the Efficiency of Generation of Terahertz Surface Plasmon Polaritons by the End-Fire Coupling Technique

    Gerasimov, V. V., Nikitin, A. K., Lemzyakov, A. G. & Azarov, I. A., Aug 2023, In: Photonics. 10, 8, 917.

    Research output: Contribution to journalArticlepeer-review

  10. First Generation of Vortex Plasmons via Vortex-Beam End-Fire Coupling

    Knyazev, B. A., Gerasimov, V. V., Kameshkov, O. E., Osintseva, N. D., Pavelyev, V. S., Tukmakov, K. N., Lemzyakov, A. G. & Azarov, I. A., 2021, 2021 46th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2021. IEEE Computer Society, 2 p. (International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz; vol. 2021-August).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

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