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  1. Atomic Force Microscopy Local Oxidation of GeO Thin Films

    Astankova, K. N., Kozhukhov, A. S., Gorokhov, E. B., Azarov, I. A. & Latyshev, A. V., 1 Dec 2018, In: Semiconductors. 52, 16, p. 2081-2084 4 p.

    Research output: Contribution to journal › Article › peer-review

  2. Characterization of Structure, Morphology, Optical and Electrical Properties of AlN–Al–V Multilayer Thin Films Fabricated by Reactive DC Magnetron Sputtering

    Миронова, М. И., Капишников, А. В., Хамуд, Г., Володин, В. А., Азаров, И. А., Юшков, И. Д., Камаев, Г. Н., Супрун, Е., Chirikov, N., Davletkildeev, N. A., Baidakov, A. N., Kovivchak, V. S., Baranova, L. V., Струнин, В. И. & Гейдт, П. В., Feb 2023, In: Coatings. 13, 2, 223.

    Research output: Contribution to journal › Article › peer-review

  3. Determination of the infrared absorption cross-section of the stretching vibrations of Ge–O bonds in GeOx films

    Zhang, F., Volodin, V. A., Astankova, K. N., Kamaev, G. N., Azarov, I. A., Prosvirin, I. P. & Vergnat, M., Jan 2022, In: Results in Chemistry. 4, 100461.

    Research output: Contribution to journal › Article › peer-review

  4. Dispersion of Attenuation of Surface Plasmon Polaritons on Metal in the Terahertz Range

    Gerasimov, V. V., Nikitin, A., Vanda, V. S., Lemzyakov, A. G. & Azarov, I. A., 8 May 2025, In: Journal of Infrared, Millimeter, and Terahertz Waves. 46, 5, 32.

    Research output: Contribution to journal › Article › peer-review

  5. Effect of annealing temperature on the morphology, structure, and optical properties of nanostructured SnO(x) films

    Timofeev, V. A., Mashanov, V. I., Nikiforov, A. I., Azarov, I. A., Loshkarev, I. D., Korolkov, I. V., Gavrilova, T. A., Yesin, M. Y. & Chetyrin, I. A., 6 Jan 2020, In: Materials Research Express. 7, 1, 9 p., 015027.

    Research output: Contribution to journal › Article › peer-review

  6. Ellipsometric In Situ Methods of Temperature Control in the Technology of Growing MBE MCT Layers

    Shvets, V. A., Marin, D. V., Azarov, I. A., Yakushev, M. V. & Rykhlitskii, S. V., Sept 2021, In: Optoelectronics, Instrumentation and Data Processing. 57, 5, p. 476-484 9 p., 5.

    Research output: Contribution to journal › Article › peer-review

  7. Ellipsometric Method for Measuring the CdTe Buffer-Layer Temperature in the Molecular-Beam Epitaxy of CdHgTe

    Shvets, V. A., Azarov, I. A., Marin, D. V., Yakushev, M. V. & Rykhlitsky, S. V., 1 Jan 2019, In: Semiconductors. 53, 1, p. 132-137 6 p.

    Research output: Contribution to journal › Article › peer-review

  8. Ellipsometric Method of Substrate Temperature Measurement in Low-Temperature Processes of Epitaxy of InSb Layers

    Shvets, V. A., Azarov, I. A., Rykhlitskii, S. V. & Toropov, A. I., 1 Jan 2019, In: Optoelectronics, Instrumentation and Data Processing. 55, 1, p. 8-15 8 p.

    Research output: Contribution to journal › Article › peer-review

  9. Ellipsometric thermometry in molecular beam epitaxy of mercury cadmium telluride

    Marin, D. V., Shvets, V. A., Azarov, I. A., Yakushev, M. V. & Rykhlitskii, S. V., Aug 2021, In: Infrared Physics and Technology. 116, 103793.

    Research output: Contribution to journal › Article › peer-review

  10. Evaluation of the Efficiency of Generation of Terahertz Surface Plasmon Polaritons by the End-Fire Coupling Technique

    Gerasimov, V. V., Nikitin, A. K., Lemzyakov, A. G. & Azarov, I. A., Aug 2023, In: Photonics. 10, 8, 917.

    Research output: Contribution to journal › Article › peer-review

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