Investigation of the Temperature Dependence of the Spectra of Optical Constants of Hg_1 –xCd_хTe Films Grown Using Molecular Beam Epitaxy

Shvets, V. A., Marin, D. V., Yakushev, M. V. & Rykhlitskii, S. V., Jan 2021, In: Optics and Spectroscopy. 129, 1, p. 29-36 8 p.

Research output: Contribution to journal › Article › peer-review

Parametric Model of the Optical Constant Spectra of Hg_1 –xCd_xTe and Determination of the Compound Composition

Shvets, V. A., Marin, D. V., Remesnik, V. G., Azarov, I. A., Yakushev, M. V. & Rykhlitskii, S. V., Dec 2020, In: Optics and Spectroscopy. 128, 12, p. 1948-1953 6 p.

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Interface Studies in HgTe/HgCdTe Quantum Wells

Mikhailov, N., Shvets, V., Ikusov, D., Uzhakov, I., Dvoretsky, S., Mynbaev, K., Dluzewski, P., Morgiel, J., Swiatek, Z., Bonchyk, O. & Izhnin, I., 1 May 2020, In: Physica Status Solidi (B) Basic Research. 257, 5, 5 p., 1900598.

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A Mask Based on a Si Epitaxial Layer for the Self-Catalytic Nanowire Growth on GaAs(111)B and GaAs(100) Substrates

Emelyanov, E. A., Nastovjak, A. G., Petrushkov, M. O., Esin, M. Y., Gavrilova, T. A., Putyato, M. A., Schwartz, N. L., Shvets, V. A., Vasev, A. V., Semyagin, B. R. & Preobrazhenskii, V. V., 1 Feb 2020, In: Technical Physics Letters. 46, 2, p. 161-164 4 p.

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MBE-grown MCT hetero- A nd nanostructures for IR and THz detectors

Dvoretsky, S. A., Mikhailov, N. N., Remesnik, V. G., Sidorov, Y. G., Shvets, V. A., Ikusov, D. G., Varavin, V. S., Yakushev, M. V., Gumenjuk-Sichevska, J. V., Golenkov, A. G., Lysiuk, I. O., Tsybrii, Z. F., Shevchik-Shekera, A. V., Sizov, F. F., Latyshev, A. V. & Aseev, A. L., 1 Sept 2019, In: Opto-electronics Review. 27, 3, p. 282-290 9 p.

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Determining the Compositional Profile of HgTe/Cd _xHg_{1 – x}Te Quantum Wells by Single-Wavelength Ellipsometry

Shvets, V. A., Mikhailov, N. N., Ikusov, D. G., Uzhakov, I. N. & Dvoretskii, S. A., 1 Aug 2019, In: Optics and Spectroscopy. 127, 2, p. 340-346 7 p.

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An Ellipsometric Technique with an ATR Module and a Monochromatic Source of Radiation for Measurement of Optical Constants of Liquids in the Terahertz Range

Azarov, I. A., Choporova, Y. Y., Shvets, V. A. & Knyazev, B. A., 1 Feb 2019, In: Journal of Infrared, Millimeter, and Terahertz Waves. 40, 2, p. 200-209 10 p.

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Ellipsometric Method for Measuring the CdTe Buffer-Layer Temperature in the Molecular-Beam Epitaxy of CdHgTe

Shvets, V. A., Azarov, I. A., Marin, D. V., Yakushev, M. V. & Rykhlitsky, S. V., 1 Jan 2019, In: Semiconductors. 53, 1, p. 132-137 6 p.

Research output: Contribution to journal › Article › peer-review

Ellipsometric Method of Substrate Temperature Measurement in Low-Temperature Processes of Epitaxy of InSb Layers

Shvets, V. A., Azarov, I. A., Rykhlitskii, S. V. & Toropov, A. I., 1 Jan 2019, In: Optoelectronics, Instrumentation and Data Processing. 55, 1, p. 8-15 8 p.

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Recent experiments at NovoFEL user stations

Knyazev, B. A., Azarov, I. A., Chesnokov, E. N., Choporova, Y. Y., Gerasimov, V. V., Gorbachev, Y. I., Getmanov, Y. V., Goldenberg, B. G., Kameshkov, O. E., Koshlyakov, P. V., Kotelnikov, I. A., Kozlov, A. S., Kubarev, V. V., Kulipanov, G. N., Malyshkin, S. B., Nikitin, A. K., Nikitin, P. A., Osintseva, N. D., Pavelyev, V. S., Peltek, S. E., & 14 othersPetrov, A. K., Popik, V. M., Salikova, T. V., Scheglov, M. A., Seredniakov, S. S., Shastin, V. N., Shevchenko, O. A., Shvets, V. A., Skorokhod, D. A., Skrinsky, A. N., Veber, S. L., Vinokurov, N. A., Voloshinov, V. B. & Zhukavin, R. K., 23 Nov 2018, In: EPJ Web of Conferences. 195, 00002.

Research output: Contribution to journal › Conference article › peer-review