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  1. 2017

  2. Dispersion of the refractive index in high-k dielectrics

    Shvets, V. A., Kruchinin, V. N. & Gritsenko, V. A., 1 Nov 2017, In: Optics and Spectroscopy (English translation of Optika i Spektroskopiya). 123, 5, p. 728-732 5 p.

    Research output: Contribution to journal › Article › peer-review

  3. Dynamics of Growth of the Native Oxide of Cd xHg1−xTe

    Sidorov, G. Y., Shvets, V. A., Sidorov, Y. G. & Varavin, V. S., 1 Nov 2017, In: Optoelectronics, Instrumentation and Data Processing. 53, 6, p. 617-624 8 p.

    Research output: Contribution to journal › Article › peer-review

  4. Polarization Pyrometry of Layered Semiconductor Structures under Conditions of Low-Temperature Technological Processes

    Azarov, I. A., Shvets, V. A., Dulin, S. A., Mikhailov, N. N., Dvoretskii, S. A., Ikusov, D. G., Uzhakov, I. N. & Rykhlitskii, S. V., 1 Nov 2017, In: Optoelectronics, Instrumentation and Data Processing. 53, 6, p. 630-638 9 p.

    Research output: Contribution to journal › Article › peer-review

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