1. 2017
  2. Mechanism of charge transport of stress induced leakage current and trap nature in thermal oxide on silicon

    Islamov, D. R., Gritsenko, V. A., Perevalov, T. V., Orlov, O. M. & Krasnikov, G. Y., 15 Aug 2017, In: Journal of Physics: Conference Series. 864, 1, 4 p., 012003.

    Research output: Contribution to journalConference articlepeer-review

  3. Oxygen polyvacancy in anatas as a filament: First principle investigation

    Perevalov, T. V. & Islamov, D. R., 15 Aug 2017, In: Journal of Physics: Conference Series. 864, 1, 4 p., 012084.

    Research output: Contribution to journalConference articlepeer-review

  4. Atomic and electronic structure of oxygen polyvacancies in ZrO2

    Perevalov, T. V. & Islamov, D. R., 25 Jun 2017, In: Microelectronic Engineering. 178, p. 275-278 4 p.

    Research output: Contribution to journalArticlepeer-review

  5. Determination of trap density in hafnia films produced by two atomic layer deposition techniques

    Islamov, D. R., Gritsenko, V. A. & Lebedev, M. S., 25 Jun 2017, In: Microelectronic Engineering. 178, p. 104-107 4 p.

    Research output: Contribution to journalArticlepeer-review

  6. Charge transport in thin hafnium and zirconium oxide films

    Islamov, D. R., Gritsenko, V. A. & Chin, A., 1 Mar 2017, In: Optoelectronics, Instrumentation and Data Processing. 53, 2, p. 184-189 6 p.

    Research output: Contribution to journalArticlepeer-review

  7. Determination of trap density in hafnium oxide films produced by different atomic layer deposition techniques

    Islamov, D. R., Gritsenko, V. A. & Lebedev, M. S., 1 Jan 2017, SEMICONDUCTORS, DIELECTRICS, AND METALS FOR NANOELECTRONICS 15: IN MEMORY OF SAMARES KAR. Misra, D., DeGendt, S., Houssa, M., Kita, K. & Landheer, D. (eds.). 1 ed. Electrochemical Society, Inc., Vol. 80. p. 265-270 6 p. (ECS Transactions; vol. 80).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

  8. Oxygen polyvacancies as conductive filament in zirconia: First principle simulation

    Perevalov, T. V. & Islamov, D. R., 1 Jan 2017, SEMICONDUCTORS, DIELECTRICS, AND METALS FOR NANOELECTRONICS 15: IN MEMORY OF SAMARES KAR. Misra, D., DeGendt, S., Houssa, M., Kita, K. & Landheer, D. (eds.). 1 ed. Electrochemical Society, Inc., Vol. 80. p. 357-362 6 p. (ECS Transactions; vol. 80).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

  9. The charge trap density evolution in wake-up and fatigue modes of FRAM

    Islamov, D. R., Orlov, O. M., Gritsenko, V. A. & Krasnikov, G. J., 1 Jan 2017, SEMICONDUCTORS, DIELECTRICS, AND METALS FOR NANOELECTRONICS 15: IN MEMORY OF SAMARES KAR. Misra, D., DeGendt, S., Houssa, M., Kita, K. & Landheer, D. (eds.). 1 ed. Electrochemical Society, Inc., Vol. 80. p. 279-281 3 p. (ECS Transactions; vol. 80).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

  10. The Nature of Defects Responsible for Transport in a Hafnia-Based Resistive Random Access Memory Element

    Islamov, D. R., Perevalov, T. V., Gritsenko, V. A., Aliev, V. S., Saraev, A. A., Kaichev, V. V., Ivanova, E. V., Zamoryanskaya, M. V. & Chin, A., 1 Jan 2017, Advances in Semiconductor Nanostructures: Growth, Characterization, Properties and Applications. Latyshev, AV., Dvurechenskii, AV. & Aseev, AL. (eds.). Elsevier Science Inc., p. 493-504 12 p.

    Research output: Chapter in Book/Report/Conference proceedingChapterResearchpeer-review

  11. 2016
  12. Three-dimensional non-linear complex model of dynamic memristor switching

    Chernov, A. A., Islamov, D. R., Pik'nik, A. A., Perevalov, T. V. & Gritsenko, V. A., 1 Jan 2016, NONVOLATILE MEMORIES 5. Karim, Z., Kobayashi, K., Shima, H., Bersuker, G., Shingubara, S., Saito, Y., Park, J. G., Magyari-Kope, B., Kubota, H. & Goux, L. (eds.). 32 ed. ELECTROCHEMICAL SOC INC, p. 95-104 10 p. (ECS Transactions; vol. 75, no. 32).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

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