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  1. 2018

  2. Electronic Structure of Oxygen Vacancies in the Orthorhombic Noncentrosymmetric Phase Hf0.5Zr0.5O2

    Perevalov, T. V., Gritsenko, V. A., Islamov, D. R. & Prosvirin, I. P., 1 Jan 2018, In: JETP Letters. 107, 1, p. 55-60 6 p.

    Research output: Contribution to journal › Article › peer-review

  3. 2017

  4. Leakage currents mechanism in thin films of ferroelectric Hf0.5Zr0.5O2

    Islamov, D. R., Chernikova, A. G., Kozodaev, M. G., Markeev, A. M., Perevalov, T. V., Gritsenko, V. A. & Orlov, O. M., 15 Aug 2017, In: Journal of Physics: Conference Series. 864, 1, 4 p., 012002.

    Research output: Contribution to journal › Conference article › peer-review

  5. Mechanism of charge transport of stress induced leakage current and trap nature in thermal oxide on silicon

    Islamov, D. R., Gritsenko, V. A., Perevalov, T. V., Orlov, O. M. & Krasnikov, G. Y., 15 Aug 2017, In: Journal of Physics: Conference Series. 864, 1, 4 p., 012003.

    Research output: Contribution to journal › Conference article › peer-review

  6. Oxygen polyvacancy in anatas as a filament: First principle investigation

    Perevalov, T. V. & Islamov, D. R., 15 Aug 2017, In: Journal of Physics: Conference Series. 864, 1, 4 p., 012084.

    Research output: Contribution to journal › Conference article › peer-review

  7. Atomic and electronic structure of oxygen polyvacancies in ZrO2

    Perevalov, T. V. & Islamov, D. R., 25 Jun 2017, In: Microelectronic Engineering. 178, p. 275-278 4 p.

    Research output: Contribution to journal › Article › peer-review

  8. Determination of trap density in hafnia films produced by two atomic layer deposition techniques

    Islamov, D. R., Gritsenko, V. A. & Lebedev, M. S., 25 Jun 2017, In: Microelectronic Engineering. 178, p. 104-107 4 p.

    Research output: Contribution to journal › Article › peer-review

  9. Charge transport in thin hafnium and zirconium oxide films

    Islamov, D. R., Gritsenko, V. A. & Chin, A., 1 Mar 2017, In: Optoelectronics, Instrumentation and Data Processing. 53, 2, p. 184-189 6 p.

    Research output: Contribution to journal › Article › peer-review

  10. Determination of trap density in hafnium oxide films produced by different atomic layer deposition techniques

    Islamov, D. R., Gritsenko, V. A. & Lebedev, M. S., 1 Jan 2017, SEMICONDUCTORS, DIELECTRICS, AND METALS FOR NANOELECTRONICS 15: IN MEMORY OF SAMARES KAR. Misra, D., DeGendt, S., Houssa, M., Kita, K. & Landheer, D. (eds.). 1 ed. Electrochemical Society, Inc., Vol. 80. p. 265-270 6 p. (ECS Transactions; vol. 80).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  11. Oxygen polyvacancies as conductive filament in zirconia: First principle simulation

    Perevalov, T. V. & Islamov, D. R., 1 Jan 2017, SEMICONDUCTORS, DIELECTRICS, AND METALS FOR NANOELECTRONICS 15: IN MEMORY OF SAMARES KAR. Misra, D., DeGendt, S., Houssa, M., Kita, K. & Landheer, D. (eds.). 1 ed. Electrochemical Society, Inc., Vol. 80. p. 357-362 6 p. (ECS Transactions; vol. 80).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  12. The charge trap density evolution in wake-up and fatigue modes of FRAM

    Islamov, D. R., Orlov, O. M., Gritsenko, V. A. & Krasnikov, G. J., 1 Jan 2017, SEMICONDUCTORS, DIELECTRICS, AND METALS FOR NANOELECTRONICS 15: IN MEMORY OF SAMARES KAR. Misra, D., DeGendt, S., Houssa, M., Kita, K. & Landheer, D. (eds.). 1 ed. Electrochemical Society, Inc., Vol. 80. p. 279-281 3 p. (ECS Transactions; vol. 80).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

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