The Nature of Defects Responsible for Transport in a Hafnia-Based Resistive Random Access Memory Element

Islamov, D. R., Perevalov, T. V., Gritsenko, V. A., Aliev, V. S., Saraev, A. A., Kaichev, V. V., Ivanova, E. V., Zamoryanskaya, M. V. & Chin, A., 1 Jan 2017, Advances in Semiconductor Nanostructures: Growth, Characterization, Properties and Applications. Latyshev, AV., Dvurechenskii, AV. & Aseev, AL. (eds.). Elsevier Science Inc., p. 493-504 12 p.

Research output: Chapter in Book/Report/Conference proceeding › Chapter › Research › peer-review

Three-dimensional non-linear complex model of dynamic memristor switching

Chernov, A. A., Islamov, D. R., Pik'nik, A. A., Perevalov, T. V. & Gritsenko, V. A., 1 Jan 2016, NONVOLATILE MEMORIES 5. Karim, Z., Kobayashi, K., Shima, H., Bersuker, G., Shingubara, S., Saito, Y., Park, J. G., Magyari-Kope, B., Kubota, H. & Goux, L. (eds.). 32 ed. ELECTROCHEMICAL SOC INC, p. 95-104 10 p. (ECS Transactions; vol. 75, no. 32).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review