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  1. 2018

  2. The Evolution of the Conductivity and Cathodoluminescence of the Films of Hafnium Oxide in the Case of a Change in the Concentration of Oxygen Vacancies

    Islamov, D. R., Gritsenko, V. A., Kruchinin, V. N., Ivanova, E. V., Zamoryanskaya, M. V. & Lebedev, M. S., 1 Oct 2018, In: Physics of the Solid State. 60, 10, p. 2050-2057 8 p.

    Research output: Contribution to journal › Article › peer-review

  3. Atomic and Electronic Structures of Intrinsic Defects in Ta2O5: Ab Initio Simulation

    Perevalov, T. V., Islamov, D. R. & Chernykh, I. G., 1 Jun 2018, In: JETP Letters. 107, 12, p. 761-765 5 p.

    Research output: Contribution to journal › Article › peer-review

  4. Electronic structure of stoichiometric and oxygen-deficient ferroelectric Hf0.5Zr0.5O2

    Perevalov, T. V., Islamov, D. R., Gritsenko, V. A. & Prosvirin, I. P., 11 May 2018, In: Nanotechnology. 29, 19, 8 p., 194001.

    Research output: Contribution to journal › Article › peer-review

  5. Electronic Structure of Oxygen Vacancies in the Orthorhombic Noncentrosymmetric Phase Hf0.5Zr0.5O2

    Perevalov, T. V., Gritsenko, V. A., Islamov, D. R. & Prosvirin, I. P., 1 Jan 2018, In: JETP Letters. 107, 1, p. 55-60 6 p.

    Research output: Contribution to journal › Article › peer-review

  6. 2017

  7. Leakage currents mechanism in thin films of ferroelectric Hf0.5Zr0.5O2

    Islamov, D. R., Chernikova, A. G., Kozodaev, M. G., Markeev, A. M., Perevalov, T. V., Gritsenko, V. A. & Orlov, O. M., 15 Aug 2017, In: Journal of Physics: Conference Series. 864, 1, 4 p., 012002.

    Research output: Contribution to journal › Conference article › peer-review

  8. Mechanism of charge transport of stress induced leakage current and trap nature in thermal oxide on silicon

    Islamov, D. R., Gritsenko, V. A., Perevalov, T. V., Orlov, O. M. & Krasnikov, G. Y., 15 Aug 2017, In: Journal of Physics: Conference Series. 864, 1, 4 p., 012003.

    Research output: Contribution to journal › Conference article › peer-review

  9. Oxygen polyvacancy in anatas as a filament: First principle investigation

    Perevalov, T. V. & Islamov, D. R., 15 Aug 2017, In: Journal of Physics: Conference Series. 864, 1, 4 p., 012084.

    Research output: Contribution to journal › Conference article › peer-review

  10. Atomic and electronic structure of oxygen polyvacancies in ZrO2

    Perevalov, T. V. & Islamov, D. R., 25 Jun 2017, In: Microelectronic Engineering. 178, p. 275-278 4 p.

    Research output: Contribution to journal › Article › peer-review

  11. Determination of trap density in hafnia films produced by two atomic layer deposition techniques

    Islamov, D. R., Gritsenko, V. A. & Lebedev, M. S., 25 Jun 2017, In: Microelectronic Engineering. 178, p. 104-107 4 p.

    Research output: Contribution to journal › Article › peer-review

  12. Charge transport in thin hafnium and zirconium oxide films

    Islamov, D. R., Gritsenko, V. A. & Chin, A., 1 Mar 2017, In: Optoelectronics, Instrumentation and Data Processing. 53, 2, p. 184-189 6 p.

    Research output: Contribution to journal › Article › peer-review

  13. Determination of trap density in hafnium oxide films produced by different atomic layer deposition techniques

    Islamov, D. R., Gritsenko, V. A. & Lebedev, M. S., 1 Jan 2017, SEMICONDUCTORS, DIELECTRICS, AND METALS FOR NANOELECTRONICS 15: IN MEMORY OF SAMARES KAR. Misra, D., DeGendt, S., Houssa, M., Kita, K. & Landheer, D. (eds.). 1 ed. Electrochemical Society, Inc., Vol. 80. p. 265-270 6 p. (ECS Transactions; vol. 80).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  14. Oxygen polyvacancies as conductive filament in zirconia: First principle simulation

    Perevalov, T. V. & Islamov, D. R., 1 Jan 2017, SEMICONDUCTORS, DIELECTRICS, AND METALS FOR NANOELECTRONICS 15: IN MEMORY OF SAMARES KAR. Misra, D., DeGendt, S., Houssa, M., Kita, K. & Landheer, D. (eds.). 1 ed. Electrochemical Society, Inc., Vol. 80. p. 357-362 6 p. (ECS Transactions; vol. 80).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  15. The charge trap density evolution in wake-up and fatigue modes of FRAM

    Islamov, D. R., Orlov, O. M., Gritsenko, V. A. & Krasnikov, G. J., 1 Jan 2017, SEMICONDUCTORS, DIELECTRICS, AND METALS FOR NANOELECTRONICS 15: IN MEMORY OF SAMARES KAR. Misra, D., DeGendt, S., Houssa, M., Kita, K. & Landheer, D. (eds.). 1 ed. Electrochemical Society, Inc., Vol. 80. p. 279-281 3 p. (ECS Transactions; vol. 80).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  16. The Nature of Defects Responsible for Transport in a Hafnia-Based Resistive Random Access Memory Element

    Islamov, D. R., Perevalov, T. V., Gritsenko, V. A., Aliev, V. S., Saraev, A. A., Kaichev, V. V., Ivanova, E. V., Zamoryanskaya, M. V. & Chin, A., 1 Jan 2017, Advances in Semiconductor Nanostructures: Growth, Characterization, Properties and Applications: Growth, Characterization, Properties and Applications. Latyshev, AV., Dvurechenskii, AV. & Aseev, AL. (eds.). Elsevier Science Publishing Company, Inc., p. 493-504 12 p. (Advances in Semiconductor Nanostructures: Growth, Characterization, Properties and Applications).

    Research output: Chapter in Book/Report/Conference proceeding › Chapter › Research › peer-review

  17. 2016

  18. Three-dimensional non-linear complex model of dynamic memristor switching

    Chernov, A. A., Islamov, D. R., Pik'nik, A. A., Perevalov, T. V. & Gritsenko, V. A., 1 Jan 2016, NONVOLATILE MEMORIES 5. Karim, Z., Kobayashi, K., Shima, H., Bersuker, G., Shingubara, S., Saito, Y., Park, J. G., Magyari-Kope, B., Kubota, H. & Goux, L. (eds.). 32 ed. Electrochemical society, p. 95-104 10 p. (ECS Transactions; vol. 75, no. 32).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

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