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  1. Atomic Processes on the Silicon Surface

    Latyshev, A. V., Fedina, L. I., Kosolobov, S. S., Sitnikov, S. V., Rogilo, D. I., Rodyakina, E. E., Nasimov, D. A., Sheglov, D. V. & Aseev, A. L., 1 Jan 2017, Advances in Semiconductor Nanostructures: Growth, Characterization, Properties and Applications. Latyshev, AV., Dvurechenskii, AV. & Aseev, AL. (eds.). Elsevier Science Publishing Company, Inc., p. 189-221 33 p. (Advances in Semiconductor Nanostructures: Growth, Characterization, Properties and Applications).

    Research output: Chapter in Book/Report/Conference proceeding › Chapter › Research › peer-review

  2. Atomic Force Microscopy Local Oxidation of GeO Thin Films

    Astankova, K. N., Kozhukhov, A. S., Gorokhov, E. B., Azarov, I. A. & Latyshev, A. V., 1 Dec 2018, In: Semiconductors. 52, 16, p. 2081-2084 4 p.

    Research output: Contribution to journal › Article › peer-review

  3. Atomic and electronic structures of the native defects responsible for the resistive effect in HfO2: ab initio simulations

    Perevalov, T. V. & Islamov, D. R., 15 Aug 2019, In: Microelectronic Engineering. 216, 5 p., 111038.

    Research output: Contribution to journal › Article › peer-review

  4. Atomic and Electronic Structures of Intrinsic Defects in Ta2O5: Ab Initio Simulation

    Perevalov, T. V., Islamov, D. R. & Chernykh, I. G., 1 Jun 2018, In: JETP Letters. 107, 12, p. 761-765 5 p.

    Research output: Contribution to journal › Article › peer-review

  5. Atomic and electronic structure of oxygen polyvacancies in ZrO2

    Perevalov, T. V. & Islamov, D. R., 25 Jun 2017, In: Microelectronic Engineering. 178, p. 275-278 4 p.

    Research output: Contribution to journal › Article › peer-review

  6. Atomic and Electronic Structure of Defect Ni Complexes and Oxygen Vacancies in HfO2 and Their Influence on Charge Transport in Memristors

    Perevalov, T. V., Islamov, D. R. & Chernov, A. A., Sept 2025, In: Journal of Experimental and Theoretical Physics. 141, 1-3, p. 113-119 7 p.

    Research output: Contribution to journal › Article › peer-review

  7. Asymmetry of anticrossing between atomic steps on metal and semiconductor surfaces

    Khoroshilov, V. S., Kazantsev, D. M., Alperovich, V. L., Coupeau, C. & Drouet, M., 28 Mar 2022, In: Journal of Physics: Conference Series. 2227, 1, 012008.

    Research output: Contribution to journal › Conference article › peer-review

  8. A Study of the Crystal Structure of Co40Fe40B20 Epitaxial Films on a Bi2Te3 Topological Insulator

    Kaveev, A. K., Suturin, S. M., Sokolov, N. S., Kokh, K. A. & Tereshchenko, O. E., 1 Mar 2018, In: Technical Physics Letters. 44, 3, p. 184-186 3 p.

    Research output: Contribution to journal › Article › peer-review

  9. Arrays of Metal Nanostructures for Plasmon-enhanced Spectroscopy

    Milekhin, A. G., Kuznetsov, S. A., Rodyakina, E. E., Anikin, K. V., Milekhin, I. A., Veber, S. L., Latyshev, A. V. & Zahn, D. R. T., 23 Apr 2020, In: Journal of Physics: Conference Series. 1461, 1, 4 p., 012100.

    Research output: Contribution to journal › Conference article › peer-review

  10. Array of dielectric Mie particles with optical surface resonances as a promising coating for thin-film photoelectronic device applications

    Shklyaev, A. A., Utkin, D. E., Tsarev, A. V. & Latyshev, A. V., Mar 2025, In: Vacuum. 233, 113976.

    Research output: Contribution to journal › Article › peer-review

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