Analytical and Technological Research Center "High Technologies & Nanostructured Materials"

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Laboratory of functional diagnostics of low-dimensional structures for nanoelectronics

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Research output

  1. Resonance Raman Scattering of Topological Insulators Bi2Te3 and Bi2 − xSbxTe3 − ySey Thin Films

    Research output: Contribution to journal › Article › peer-review

  2. Polarization-resolved resonant Raman excitation of surface and bulk electronic bands and phonons in MBE-grown topological insulator thin films

    Research output: Contribution to journal › Article › peer-review

  3. Nature of the Pits on the Lattice-Matched InAlAs Layer Surface Grown on the (001) InP Substrate

    Research output: Contribution to journal › Article › peer-review

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ID: 3531896