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Способ измерения латерального размера литографического рисунка с помощью сканирующего зондового микроскопа.
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Applied Physics Division
Laboratory of functional diagnostics of low-dimensional structures for nanoelectronics
Section of Physical Methods of Solid State Research
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Cite this
Иван Владимирович Николаев
(Author)
Павел Викторович Гейдт
(Author)
Original language
Russian
Patent number
125
Priority date
28.12.2024
Filing date
28.12.2024
Publication status
Published -
28 Dec 2024
ID: 61325162