Near-field infrared spectroscopy of SiOx nanowires › Research Explorer

DOI

https://doi.org/10.1016/j.apsusc.2022.152583
Final published version

I. A. Milekhin
A. S. Kozhukhov
D. V. Sheglov
L. I. Fedina
A. G. Milekhin
A. V. Latyshev
D. R.T. Zahn

Original language	English
Article number	152583
Journal	Applied Surface Science
Volume	584
DOIs	https://doi.org/10.1016/j.apsusc.2022.152583
Publication status	Published - 15 May 2022

OECD FOS+WOS

2.05 MATERIALS ENGINEERING
1.03 PHYSICAL SCIENCES AND ASTRONOMY
1.04 CHEMICAL SCIENCES

Research areas

Atomic force microscopy, Local anodic oxidation, Near-field infrared spectroscopy, Optical phonons, Silicon oxide nanowire

ID: 35380045