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  1. 2024

  2. Surface morphology analysis of CdTe buffer layers using ellipsometry and interference profilometry to create a technique for monitoring the growth of buffer layers

    Shvets, V. A., Marin, D. V., Kuznetsova, L. S., Azarov, I. A., Yakushev, M. V. & Rykhlitskii, S. V., 20 Jul 2024, In: Journal of Optical Technology (A Translation of Opticheskii Zhurnal). 91, 2, p. 91-95 5 p.

    Research output: Contribution to journal › Article › peer-review

  3. Temperature Dependence of the Spectra of Optical Constants of CdTe in the Region of the Absorption Edge

    Shvets, V. A., Marin, D. V., Yakushev, M. V. & Rykhiitskii, S. V., Apr 2024, In: Optics and Spectroscopy. 132, 4, p. 403-408 6 p.

    Research output: Contribution to journal › Article › peer-review

  4. In situ Ellipsometric Control of Growth Processes of ZnTe and CdTe Buffer Layers in Technology of Molecular Beam Epitaxy of Mercury Cadmium Telluride

    Shvets, V. A., Marin, D. V., Yakushev, M. V. & Rykhlitskii, S. V., Jan 2024, In: Semiconductors. 58, 1, p. 67-72 6 p.

    Research output: Contribution to journal › Article › peer-review

ID: 42209264