1. 2019
  2. Plasmon-Enhanced Near-Field Optical Spectroscopy of Multicomponent Semiconductor Nanostructures

    Anikin, K. V., Milekhin, A. G., Rahaman, M., Duda, T. A., Milekhin, I. A., Rodyakina, E. E., Vasiliev, R. B., Dzhagan, V. M., Zahn, D. R. T. & Latyshev, A. V., 1 Sept 2019, In: Optoelectronics, Instrumentation and Data Processing. 55, 5, p. 488-494 7 p.

    Research output: Contribution to journalArticlepeer-review

  3. Real-time observation of self-interstitial reactions on an atomically smooth silicon surface

    Kosolobov, S., Nazarikov, G., Sitnikov, S., Pshenichnyuk, I., Fedina, L. & Latyshev, A., 1 Sept 2019, In: Surface Science. 687, p. 25-33 9 p.

    Research output: Contribution to journalArticlepeer-review

  4. Step bunching phenomena on Si(0 0 1) surface induced by DC heating during sublimation and Si deposition

    Rodyakina, E. E., Sitnikov, S. V., Rogilo, D. I. & Latyshev, A. V., 15 Aug 2019, In: Journal of Crystal Growth. 520, p. 85-88 4 p.

    Research output: Contribution to journalArticlepeer-review

  5. Electromigration Effect on Vacancy Islands Nucleation on Si(100) Surface during Sublimation

    Sitnikov, S. V., Rodyakina, E. E. & Latyshev, A. V., 1 Jun 2019, In: Semiconductors. 53, 6, p. 795-799 5 p.

    Research output: Contribution to journalArticlepeer-review

  6. The role of a plasmonic substrate on the enhancement and spatial resolution of tip-enhanced Raman scattering

    Rahaman, M., Milekhin, A. G., Mukherjee, A., Rodyakina, E. E., Latyshev, A. V., Dzhagan, V. M. & Zahn, D. R. T., 1 May 2019, In: Faraday Discussions. 214, p. 309-323 15 p.

    Research output: Contribution to journalArticlepeer-review

  7. Evolution of Micropits on Large Terraces of the Si(111) Surface during High-Temperature Annealing

    Petrov, A. S., Sitnikov, S. V., Kosolobov, S. S. & Latyshev, A. V., 1 Apr 2019, In: Semiconductors. 53, 4, p. 434-438 5 p.

    Research output: Contribution to journalArticlepeer-review

  8. Resonance reflection of light by ordered silicon nanopillar arrays with the vertical p-n junction

    Basalaeva, L. S., Nastaushev, Y. V., Kryzhanovskaya, N. V., Moiseev, E. I., Radnatarov, D. A., Khripunov, S. A., Utkin, D. E., Chistokhin, I. B., Latyshev, A. V. & Dultsev, F. N., 28 Feb 2019, In: Thin Solid Films. 672, p. 109-113 5 p.

    Research output: Contribution to journalArticlepeer-review

  9. Electromigration effect on the surface morphology during the Ge deposition on Si(1 1 1) at high temperatures

    Shklyaev, A. A. & Latyshev, A. V., 28 Jan 2019, In: Applied Surface Science. 465, p. 10-14 5 p.

    Research output: Contribution to journalArticlepeer-review

  10. 2018
  11. Atomic Force Microscopy Local Oxidation of GeO Thin Films

    Astankova, K. N., Kozhukhov, A. S., Gorokhov, E. B., Azarov, I. A. & Latyshev, A. V., 1 Dec 2018, In: Semiconductors. 52, 16, p. 2081-2084 4 p.

    Research output: Contribution to journalArticlepeer-review

  12. A highly porous surface of synthetic monocrystalline diamond: Effect of etching by Fe nanoparticles in hydrogen atmosphere

    Chepurov, A., Sonin, V., Shcheglov, D., Latyshev, A., Filatov, E. & Yelisseyev, A., 1 Nov 2018, In: International Journal of Refractory Metals and Hard Materials. 76, p. 12-15 4 p.

    Research output: Contribution to journalArticlepeer-review

ID: 3436806