1. 2025
  2. Polarization-dependent TERS imaging of a single AlN nanorod

    Milekhin, I. A., Milekhin, A. G., Tsarev, A. V., Latyshev, A. V. & Zahn, D. R. T., 30 Dec 2025, In: Applied Surface Science. 714, 7 p., 164403.

    Research output: Contribution to journalArticlepeer-review

  3. Wavelength dependent gap-mode TERS by CdSe nanocrystals on a single Au nanodisk

    Milekhin, I. A., Rahaman, M., Tsarev, A. V., Anikin, K. V., Rodyakina, E. E., Duda, T. A., Saidzhonov, B. M., Vasiliev, R. B., Milekhin, A. G., Latyshev, A. V. & Zahn, D. R. T., 30 Mar 2025, In: Applied Surface Science. 686, 162144.

    Research output: Contribution to journalArticlepeer-review

  4. Контроль формирования слоев графена на подложках 6H-SiC(0001) методом in situ дифракции быстрых электронов на отражение

    Дураков, Д. Е., Петров, А. С., Рогило, Д. И., Макеева, А. А., Насимов, Д. А., Никифоров, Д. Ф., Курусь, Н. Н., Милёхин, А. Г., Щеглов, Д. В. & Латышев, А. В., 2025, In: Физика и техника полупроводников. 59, 2, p. 102-108

    Research output: Contribution to journalArticlepeer-review

  5. 2024
  6. Capture zone scaling in 2D Ge island nucleation on Si(111)-(7 × 7) at elevated temperatures

    Makeeva, A. A., Petrov, A. S., Rogilo, D. I., Sheglov, D. V. & Latyshev, A. V., 1 Dec 2024, In: Journal of Crystal Growth. 647, 127873.

    Research output: Contribution to journalArticlepeer-review

  7. Features of Microwave Photoconductance of Quantum Point Contact and Silicon Field-Effect Transistor

    Jaroshevich, A. S., Tkachenko, V. A., Kvon, Z. D., Kuzmin, N. S., Tkachenko, O. A., Baksheev, D. G., Marchishin, I. V., Bakarov, A. K., Rodyakina, E. E., Antonov, V. A., Popov, V. P. & Latyshev, A. V., Sept 2024, In: Bulletin of the Russian Academy of Sciences: Physics. 88, 9, p. 1505-1512 8 p.

    Research output: Contribution to journalArticlepeer-review

  8. Low-Temperature Conductance of Nanosystems under Conditions of Weak Coupling with a Microwave Generator

    Jaroshevich, A. S., Tkachenko, V. A., Kvon, Z. D., Kuzmin, N. S., Tkachenko, O. A., Baksheev, D. G., Marchishin, I. V., Bakarov, A. K., Rodyakina, E. E., Antonov, V. A., Popov, V. P. & Latyshev, A. V., Aug 2024, In: Optoelectronics, Instrumentation and Data Processing. 60, 4, p. 505-521 17 p., 8.

    Research output: Contribution to journalArticlepeer-review

  9. Low-defect-density SnSe2 films nucleated via thin layer crystallization

    Ponomarev, S. A., Zakhozhev, K. E., Rogilo, D. I., Gutakovsky, A. K., Kurus, N. N., Kokh, K. A., Sheglov, D. V., Milekhin, A. G. & Latyshev, A. V., 1 Apr 2024, In: Journal of Crystal Growth. 631, 5 p., 127615.

    Research output: Contribution to journalArticlepeer-review

  10. Sn-mediated transformations on Si(111) surface: reconstructions, electromigration, homoepitaxy

    Petrov, A. S., Rogilo, D. I., Vergules, A. I., Mansurov, V. G., Sheglov, D. V. & Latyshev, A. V., Mar 2024, In: Surface Science. 741, 13 p., 122418.

    Research output: Contribution to journalArticlepeer-review

  11. High-temperature indium adsorption on Bi2Se3(0001) surface studied by in situ reflection electron microscopy

    Ponomarev, S. A., Rogilo, D. I., Nasimov, D. A., Kokh, K. A., Sheglov, D. V. & Latyshev, A. V., 15 Feb 2024, In: Journal of Crystal Growth. 628, 127545.

    Research output: Contribution to journalArticlepeer-review

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