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  1. In situ reflection electron microscopy for investigation of surface processes on Bi2Se3(0001)

    Ponomarev, S. A., Rogilo, D. I., Kurus, N. N., Basalaeva, L. S., Kokh, K. A., Milekhin, A. G., Sheglov, D. V. & Latyshev, A. V., 13 Sept 2021, In: Journal of Physics: Conference Series. 1984, 1, 012016.

    Research output: Contribution to journal › Conference article › peer-review

  2. High-temperature indium adsorption on Bi2Se3(0001) surface studied by in situ reflection electron microscopy

    Ponomarev, S. A., Rogilo, D. I., Nasimov, D. A., Kokh, K. A., Sheglov, D. V. & Latyshev, A. V., 15 Feb 2024, In: Journal of Crystal Growth. 628, 127545.

    Research output: Contribution to journal › Article › peer-review

  3. Etching Kinetics of Si(111) Surface by Selenium Molecular Beam

    Ponomarev, S. A., Rogilo, D. I., Petrov, A. S., Sheglov, D. V. & Latyshev, A. V., Sept 2020, In: Optoelectronics, Instrumentation and Data Processing. 56, 5, p. 449-455 7 p.

    Research output: Contribution to journal › Article › peer-review

  4. Capture zone scaling in 2D Ge island nucleation on Si(111)-(7 × 7) at elevated temperatures

    Makeeva, A. A., Petrov, A. S., Rogilo, D. I., Sheglov, D. V. & Latyshev, A. V., 1 Dec 2024, In: Journal of Crystal Growth. 647, 127873.

    Research output: Contribution to journal › Article › peer-review

  5. 2D Si island nucleation on the Si(111) surface at initial and late growth stages: On the role of step permeability in pyramidlike growth

    Rogilo, D. I., Fedina, L. I., Kosolobov, S. S., Ranguelov, B. S. & Latyshev, A. V., 1 Jan 2017, In: Journal of Crystal Growth. 457, p. 188-195 8 p.

    Research output: Contribution to journal › Article › peer-review

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