Capture zone scaling in 2D Ge island nucleation on Si(111)-(7 × 7) at elevated temperatures › Research Explorer

DOI

https://doi.org/10.1016/j.jcrysgro.2024.127873
Final published version

A. A. Makeeva
A. S. Petrov
D. I. Rogilo
D. V. Sheglov
A. V. Latyshev

Original language	English
Article number	127873
Journal	Journal of Crystal Growth
Volume	647
DOIs	https://doi.org/10.1016/j.jcrysgro.2024.127873
Publication status	Published - 1 Dec 2024

OECD FOS+WOS

1.03.UB PHYSICS, APPLIED

ID: 60779026