In situ Ellipsometric Control of Growth Processes of ZnTe and CdTe Buffer Layers in Technology of Molecular Beam Epitaxy of Mercury Cadmium Telluride

Shvets, V. A., Marin, D. V., Yakushev, M. V. & Rykhlitskii, S. V., Jan 2024, In: Semiconductors. 58, 1, p. 67-72 6 p.

Research output: Contribution to journal › Article › peer-review

In situ spectroscopic ellipsometry for temperature control in molecular beam epitaxy of HgCdTe

Shvets, V. A., Marin, D. V., Azarov, I. A., Yakushev, M. V. & Rykhlitskii, S. V., 1 Dec 2022, In: Journal of Crystal Growth. 599, 126898.

Research output: Contribution to journal › Article › peer-review

Interface Studies in HgTe/HgCdTe Quantum Wells

Mikhailov, N., Shvets, V., Ikusov, D., Uzhakov, I., Dvoretsky, S., Mynbaev, K., Dluzewski, P., Morgiel, J., Swiatek, Z., Bonchyk, O. & Izhnin, I., 1 May 2020, In: Physica Status Solidi (B) Basic Research. 257, 5, 5 p., 1900598.

Research output: Contribution to journal › Article › peer-review

Investigation of the Temperature Dependence of the Spectra of Optical Constants of Hg_1 –xCd_хTe Films Grown Using Molecular Beam Epitaxy

Shvets, V. A., Marin, D. V., Yakushev, M. V. & Rykhlitskii, S. V., Jan 2021, In: Optics and Spectroscopy. 129, 1, p. 29-36 8 p.

Research output: Contribution to journal › Article › peer-review

MBE-grown MCT hetero- A nd nanostructures for IR and THz detectors

Dvoretsky, S. A., Mikhailov, N. N., Remesnik, V. G., Sidorov, Y. G., Shvets, V. A., Ikusov, D. G., Varavin, V. S., Yakushev, M. V., Gumenjuk-Sichevska, J. V., Golenkov, A. G., Lysiuk, I. O., Tsybrii, Z. F., Shevchik-Shekera, A. V., Sizov, F. F., Latyshev, A. V. & Aseev, A. L., 1 Sept 2019, In: Opto-electronics Review. 27, 3, p. 282-290 9 p.

Research output: Contribution to journal › Article › peer-review

Parametric Model of the Optical Constant Spectra of Hg_1 –xCd_xTe and Determination of the Compound Composition

Shvets, V. A., Marin, D. V., Remesnik, V. G., Azarov, I. A., Yakushev, M. V. & Rykhlitskii, S. V., Dec 2020, In: Optics and Spectroscopy. 128, 12, p. 1948-1953 6 p.

Research output: Contribution to journal › Article › peer-review

Polarization Pyrometry of Layered Semiconductor Structures under Conditions of Low-Temperature Technological Processes

Azarov, I. A., Shvets, V. A., Dulin, S. A., Mikhailov, N. N., Dvoretskii, S. A., Ikusov, D. G., Uzhakov, I. N. & Rykhlitskii, S. V., 1 Nov 2017, In: Optoelectronics, Instrumentation and Data Processing. 53, 6, p. 630-638 9 p.

Research output: Contribution to journal › Article › peer-review

Recent experiments at NovoFEL user stations

Knyazev, B. A., Azarov, I. A., Chesnokov, E. N., Choporova, Y. Y., Gerasimov, V. V., Gorbachev, Y. I., Getmanov, Y. V., Goldenberg, B. G., Kameshkov, O. E., Koshlyakov, P. V., Kotelnikov, I. A., Kozlov, A. S., Kubarev, V. V., Kulipanov, G. N., Malyshkin, S. B., Nikitin, A. K., Nikitin, P. A., Osintseva, N. D., Pavelyev, V. S., Peltek, S. E., & 14 othersPetrov, A. K., Popik, V. M., Salikova, T. V., Scheglov, M. A., Seredniakov, S. S., Shastin, V. N., Shevchenko, O. A., Shvets, V. A., Skorokhod, D. A., Skrinsky, A. N., Veber, S. L., Vinokurov, N. A., Voloshinov, V. B. & Zhukavin, R. K., 23 Nov 2018, In: EPJ Web of Conferences. 195, 00002.

Research output: Contribution to journal › Conference article › peer-review

Surface morphology analysis of CdTe buffer layers using ellipsometry and interference profilometry to create a technique for monitoring the growth of buffer layers

Shvets, V. A., Marin, D. V., Kuznetsova, L. S., Azarov, I. A., Yakushev, M. V. & Rykhlitskii, S. V., 20 Jul 2024, In: Journal of Optical Technology (A Translation of Opticheskii Zhurnal). 91, 2, p. 91-95 5 p., 6.

Research output: Contribution to journal › Article › peer-review

Temperature Dependence of the Spectra of Optical Constants of CdTe in the Region of the Absorption Edge

Shvets, V. A., Marin, D. V., Yakushev, M. V. & Rykhiitskii, S. V., Apr 2024, In: Optics and Spectroscopy. 132, 4, p. 403-408 6 p.

Research output: Contribution to journal › Article › peer-review