1. 2017
  2. The Nature of Defects Responsible for Transport in a Hafnia-Based Resistive Random Access Memory Element

    Islamov, D. R., Perevalov, T. V., Gritsenko, V. A., Aliev, V. S., Saraev, A. A., Kaichev, V. V., Ivanova, E. V., Zamoryanskaya, M. V. & Chin, A., 1 Jan 2017, Advances in Semiconductor Nanostructures: Growth, Characterization, Properties and Applications: Growth, Characterization, Properties and Applications. Latyshev, AV., Dvurechenskii, AV. & Aseev, AL. (eds.). Elsevier Science Publishing Company, Inc., p. 493-504 12 p. (Advances in Semiconductor Nanostructures: Growth, Characterization, Properties and Applications).

    Research output: Chapter in Book/Report/Conference proceedingChapterResearchpeer-review

  3. 2016
  4. Localized surface plasmons in structures with linear Au nanoantennas on a SiO2/Si surface

    Milekhin, I. A., Kuznetsov, S. A., Rodyakina, E. E., Milekhin, A. G., Latyshev, A. V. & Zahn, D. R. T., 2016, In: Beilstein Journal of Nanotechnology. 7, 1, p. 1519-1526 8 p.

    Research output: Contribution to journalArticlepeer-review

  5. 2015
  6. 2011
  7. Технология получения высокоупорядоченной ступенчатой поверхности Si (111) -7x7

    Романюк, К. Н. & Шкляев, А. А., 25 Nov 2011, Редакционно-издательский центр НГУ, Patent No. 6, Priority date 22 Nov 2011

    Research output: PatentKnow-how registration

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