Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
Simulation of Surface Sputtering of Fused Quartz by Clusters of Different Gases. / Николаев, Иван Владимирович; Стишенко, Павел Викторович; Коробейщиков, Николай Геннадьевич и др.
в: AIP Conference Proceedings, Том 2784, 040005, 26.07.2023.Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
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TY - JOUR
T1 - Simulation of Surface Sputtering of Fused Quartz by Clusters of Different Gases
AU - Николаев, Иван Владимирович
AU - Стишенко, Павел Викторович
AU - Коробейщиков, Николай Геннадьевич
AU - Яковлев, Владимир Владимирович
N1 - ACKNOWLEDGMENTS: This study was supported by the Russian Science Foundation (grant No. 21-19-00046). The Novosibirsk State University Computer Center is gratefully acknowledged for providing supercomputer facilities.
PY - 2023/7/26
Y1 - 2023/7/26
N2 - The use of gas cluster ion beams makes it possible to diagnose and uniquely modify the surfaces of different materials. In this work, the influence of neon, argon, and krypton clusters on silicon dioxide is studied by the molecular dynamics method. The interaction of noble gases with solid is simulation at oblique incidence and with the following cluster parameters: cluster size N = 561 atom/cluster and total kinetic cluster energy E = 22 keV. Different selectivity of sputtering is revealed and images of the cross-section of craters with different gases are presented. Among the sputtered products, the oxygen atoms are predominated. It is shown that the heavier the cluster, the less the depth of the resulting crater.
AB - The use of gas cluster ion beams makes it possible to diagnose and uniquely modify the surfaces of different materials. In this work, the influence of neon, argon, and krypton clusters on silicon dioxide is studied by the molecular dynamics method. The interaction of noble gases with solid is simulation at oblique incidence and with the following cluster parameters: cluster size N = 561 atom/cluster and total kinetic cluster energy E = 22 keV. Different selectivity of sputtering is revealed and images of the cross-section of craters with different gases are presented. Among the sputtered products, the oxygen atoms are predominated. It is shown that the heavier the cluster, the less the depth of the resulting crater.
UR - https://www.scopus.com/record/display.uri?eid=2-s2.0-85176732815&origin=inward&txGid=1febd4f53d91e74f1734774313527682
U2 - 10.1063/5.0140411
DO - 10.1063/5.0140411
M3 - Article
VL - 2784
JO - AIP Conference Proceedings
JF - AIP Conference Proceedings
SN - 0094-243X
M1 - 040005
ER -
ID: 53262407