Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
Indium-Induced Crystallization of Thin Films of Amorphous Silicon Suboxide. / Zamchiy, A. O.; Baranov, E. A.; Merkulova, I. E. и др.
в: Technical Physics Letters, Том 46, № 6, 01.06.2020, стр. 583-586.Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
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TY - JOUR
T1 - Indium-Induced Crystallization of Thin Films of Amorphous Silicon Suboxide
AU - Zamchiy, A. O.
AU - Baranov, E. A.
AU - Merkulova, I. E.
AU - Lunev, N. A.
AU - Volodin, V. A.
AU - Maksimovskii, E. A.
N1 - Publisher Copyright: © 2020, Pleiades Publishing, Ltd.
PY - 2020/6/1
Y1 - 2020/6/1
N2 - A new method of obtaining polycrystalline silicon is proposed which is based on indium-induced crystallization of thin films of amorphous silicon suboxide with stoichiometric coefficient 0.5 (a-SiO0.5). It is established that the use of indium in the course of a-SiO0.5 annealing allows the crystallization temperature to be reduced to 600°C, which is significantly below the temperature of solid-phase crystallization of this material (850°C). The process of indium-induced crystallization of a-SiO0.5 in high vacuum leads to the formation of free-standing micron sized particles of crystalline silicon.
AB - A new method of obtaining polycrystalline silicon is proposed which is based on indium-induced crystallization of thin films of amorphous silicon suboxide with stoichiometric coefficient 0.5 (a-SiO0.5). It is established that the use of indium in the course of a-SiO0.5 annealing allows the crystallization temperature to be reduced to 600°C, which is significantly below the temperature of solid-phase crystallization of this material (850°C). The process of indium-induced crystallization of a-SiO0.5 in high vacuum leads to the formation of free-standing micron sized particles of crystalline silicon.
KW - indium-induced crystallization
KW - polycrystalline silicon
KW - silicon suboxide
KW - thin films
UR - http://www.scopus.com/inward/record.url?scp=85088592425&partnerID=8YFLogxK
U2 - 10.1134/S1063785020060280
DO - 10.1134/S1063785020060280
M3 - Article
AN - SCOPUS:85088592425
VL - 46
SP - 583
EP - 586
JO - Technical Physics Letters
JF - Technical Physics Letters
SN - 1063-7850
IS - 6
ER -
ID: 24831256