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On Raman scattering cross section ratio of crystalline and microcrystalline to amorphous silicon

Research output: Contribution to journal › Article › peer-review

DOI

https://doi.org/10.1063/1.5037008
Final published version

D. M. Zhigunov
G. N. Kamaev
P. K. Kashkarov
V. A. Volodin

Original language	English
Article number	023101
Number of pages	4
Journal	Applied Physics Letters
Volume	113
Issue number	2
DOIs	https://doi.org/10.1063/1.5037008
Publication status	Published - 9 Jul 2018

Research areas

OPTICAL-PROPERTIES, POLYCRYSTALLINE SILICON, VOLUME FRACTION, EXCIMER-LASER, THIN-FILMS, SPECTROSCOPY, TEMPERATURE, SI, THICKNESS, HYDROGEN

OECD FOS+WOS

ID: 14727146