Memristor effect in GeO[SiO2] and GeO[SiO] solid alloys films › Research Explorer

DOI

https://doi.org/10.1063/1.5079690
Final published version

V. A. Volodin
G. N. Kamaev
V. A. Gritsenko
A. A. Gismatulin
A. Chin
M. Vergnat

Original language	English
Article number	233104
Number of pages	5
Journal	Applied Physics Letters
Volume	114
Issue number	23
DOIs	https://doi.org/10.1063/1.5079690
Publication status	Published - 10 Jun 2019

Research areas

NANOCRYSTALS, DEVICES, FIELD, SI

OECD FOS+WOS

ID: 20588941