• I. E. Tyschenko
  • R. A. Khmelnitsky
  • V. V. Saraykin
  • V. A. Volodin
  • V. P. Popov
Translated title of the contributionДиффузия германия из захороненного слоя SiO2 и формирование фазы SiGe
Original languageEnglish
Pages (from-to)215-222
Number of pages8
JournalSemiconductors
Volume56
Issue number3
DOIs
Publication statusPublished - Mar 2022

    OECD FOS+WOS

  • 2.05 MATERIALS ENGINEERING
  • 1.03 PHYSICAL SCIENCES AND ASTRONOMY

    Research areas

  • diffusion, ion implantation, SiGe, silicon-on-insulator

ID: 36166941