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Способ измерения модуля упругости полистирола и других полимеров с помощью сканирующего зондового микроскопа
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Applied Physics Division
Laboratory of functional diagnostics of low-dimensional structures for nanoelectronics
Section of Physical Methods of Solid State Research
Overview
Cite this
Иван Владимирович Николаев
(Author)
Павел Викторович Гейдт
(Author)
Original language
Russian
Patent number
124
Priority date
28.12.2024
Filing date
28.12.2024
Publication status
Published -
28 Dec 2024
State classification of scientific and technological information
29.19.22 Physics of nanostructures. Diskeraser-wide structure. Mesoscopic structures
47.09.48 Nanomaterials for electronics
90.27.28 Mechanical Measurements
ID: 61325074
