Resonance Raman Scattering of Topological Insulators Bi2Te3 and Bi2 − xSbxTe3 − ySey Thin Films

Original language	English
Journal	Journal of Raman Spectroscopy
DOIs	https://doi.org/10.1002/jrs.6751
Publication status	Published - 30 Nov 2024

Fröhlich strength, Raman resonance, anharmonic coupling, polarization-resolved Raman spectroscopy, topological insulators

ID: 61245012