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Chemical Composition Dependent Raman Scattering Spectroscopy of MBE Grown Manganese - Based Bismuth Telluride Topological Insulator Thin Films

Research output: Contribution to journal › Article › peer-review

Analytical and Technological Research Center "High Technologies & Nanostructured Materials"
Laboratory of functional diagnostics of low-dimensional structures for nanoelectronics

DOI

https://doi.org/10.1002/jrs.6779
Final published version

N. Kumar
Denis V Ishchenko
Ilya A Milekhin
Ekaterina D Kyrova
Evgeny V Fedosenko
Alexander G Milekhin
Oleg E Tereshchenko

Original language	English
Journal	Journal of Raman Spectroscopy
DOIs	https://doi.org/10.1002/jrs.6779
Publication status	Published - 13 Feb 2025

OECD FOS+WOS

2.11.XQ SPECTROSCOPY

ID: 64823272