51 - 56 out of 56Page size: 10
Sort by: Title

  1. Determining the Depth of Penetration of the THz Surface Plasmon Polariton Field into Air by the Shielding Technique

    Kukotenko, V. D., Gerasimov, V. V., Vanda, V. S., Lemzyakov, A. G., Azarov, I. A. & Nikitin, A., Dec 2025, In: Plasmonics. 20, 12, p. 11461-11469 9 p., 1.

    Research output: Contribution to journal › Article › peer-review

  2. Determination of the infrared absorption cross-section of the stretching vibrations of Ge–O bonds in GeOx films

    Zhang, F., Volodin, V. A., Astankova, K. N., Kamaev, G. N., Azarov, I. A., Prosvirin, I. P. & Vergnat, M., Jan 2022, In: Results in Chemistry. 4, 100461.

    Research output: Contribution to journal › Article › peer-review

  3. Characterization of Structure, Morphology, Optical and Electrical Properties of AlN–Al–V Multilayer Thin Films Fabricated by Reactive DC Magnetron Sputtering

    Миронова, М. И., Капишников, А. В., Хамуд, Г., Володин, В. А., Азаров, И. А., Юшков, И. Д., Камаев, Г. Н., Супрун, Е., Chirikov, N., Davletkildeev, N. A., Baidakov, A. N., Kovivchak, V. S., Baranova, L. V., Струнин, В. И. & Гейдт, П. В., Feb 2023, In: Coatings. 13, 2, 223.

    Research output: Contribution to journal › Article › peer-review

  4. Atomic Force Microscopy Local Oxidation of GeO Thin Films

    Astankova, K. N., Kozhukhov, A. S., Gorokhov, E. B., Azarov, I. A. & Latyshev, A. V., 1 Dec 2018, In: Semiconductors. 52, 16, p. 2081-2084 4 p.

    Research output: Contribution to journal › Article › peer-review

  5. Application of noncontact terahertz surface plasmon interferometry for determination of optical constants of thin tetraaminodiphenyl films

    Gerasimov, V. V., Vanda, V. S., Lemzyakov, A. G., Azarov, I. A., Nikolaev, N. A., Stepanov, V. A., Fromichev, D. V. & Nikitin, A. K., Nov 2026, In: Optics and Lasers in Engineering. 206, 13 p.

    Research output: Contribution to journal › Article › peer-review

  6. 1.534 µm Er electroluminescence in the RF magnetron deposited In2O3 : Er films on a Si substrate

    Feklistov, K. V., Lemzyakov, A. G., Abramkin, D. S., Svit, K. A., Pugachev, A. M., Volodin, V. A., Marin, D. V., Spesivsev, E. V., Azarov, I. A., Safronov, L. N., Kochubey, S. A., Ershov, K. S., Kapishnikov, A. V., Shmakov, A. N., Shklyaev, A. A. & Zhivodkov, Y. A., 30 Jun 2026, In: Modern Electronic Materials. 12, 2, p. 95-102 8 p.

    Research output: Contribution to journal › Article › peer-review

Previous 12 3 4 5 6 Next

ID: 12587340