1. 2024
  2. Raman scattering spectroscopy of MBE grown thin film topological insulator Bi2−xSbxTe3−ySey

    Kumar, N., Surovtsev, N. V., Yunin, P. A., Ishchenko, D. V., Milekhin, I. A., Lebedev, S. P., Lebedev, A. A. & Tereshchenko, O. E., 12 Apr 2024, In: Physical Chemistry Chemical Physics. 26, 17, p. 13497-13505 9 p.

    Research output: Contribution to journalArticlepeer-review

  3. Interfacing two-dimensional and magnetic topological insulators: Bi bilayer on MnBi2Te4-family materials

    Klimovskikh, I. I., Eremeev, S. V., Estyunin, D. A., Filnov, S. O., Shimada, K., Golyashov, V. A., Solovova, N. Y., Tereshchenko, O. E., Kokh, K. A., Frolov, A. S., Sergeev, A. I., Stolyarov, V. S., Trontl, V. M., Petaccia, L., Di Santo, G., Tallarida, M., Dai, J., Blanco-Canosa, S., Valla, T., Shikin, A. M., & 1 othersChulkov, E. V., Aug 2024, In: Materials Today Advances. 23, 9 p., 100511.

    Research output: Contribution to journalArticlepeer-review

  4. Nonlinear Hall Coefficient in Films of a Three-Dimensional Topological Insulator

    Stepina, N. P., Bazhenov, A. O., Shumilin, A. V., Zhdanov, E. Y., Ishchenko, D. V., Kirienko, V. V., Aksenov, M. S. & Tereshchenko, O. E., Aug 2024, In: JETP Letters. 120, 3, p. 199-204 6 p.

    Research output: Contribution to journalArticlepeer-review

  5. Na2KSb/CsxSb interface engineering for high-efficiency photocathodes

    Rozhkov, S. A., Bakin, V. V., Rusetsky, V. S., Kustov, D. A., Golyashov, V. A., Demin, A. Y., Scheibler, H. E., Alperovich, V. L. & Tereshchenko, O. E., 2 Aug 2024, In: Physical Review Applied. 22, 2, 024008.

    Research output: Contribution to journalArticlepeer-review

  6. Polarization-resolved resonant Raman excitation of surface and bulk electronic bands and phonons in MBE-grown topological insulator thin films

    Kumar, N., Ishchenko, D. V., Milekhin, I. A., Yunin, P. A., Kyrova, E. D., Korsakov, A. V. & Tereshchenko, O. E., 5 Nov 2024, In: Physical Chemistry Chemical Physics. 26, 46, p. 29036-29047 12 p.

    Research output: Contribution to journalArticlepeer-review

  7. Resonance Raman Scattering of Topological Insulators Bi2Te3 and Bi2 − xSbxTe3 − ySey Thin Films

    Kumar, N., Surovtsev, N. V., Ishchenko, D. V., Yunin, P. A., Milekhin, I. A., Tereshchenko, O. E. & Milekhin, A. G., 26 Nov 2024, In: Journal of Raman Spectroscopy. 10 p.

    Research output: Contribution to journalArticlepeer-review

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