Raman scattering spectroscopy of MBE grown thin film topological insulator Bi2−xSbxTe3−ySey › Research Explorer

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Raman scattering spectroscopy of MBE grown thin film topological insulator Bi2−xSbxTe3−ySey

Research output: Contribution to journal › Article › peer-review

Analytical and Technological Research Center "High Technologies & Nanostructured Materials"

DOI

https://doi.org/10.1039/d4cp01169d
Final published version

Niranjan Kumar
N. V. Surovtsev
P. A. Yunin
D. V. Ishchenko
I. A. Milekhin
S. P. Lebedev
A. A. Lebedev
O. E. Tereshchenko

Original language	English
Pages (from-to)	13497-13505
Number of pages	9
Journal	Physical Chemistry Chemical Physics
Volume	26
Issue number	17
DOIs	https://doi.org/10.1039/d4cp01169d
Publication status	Published - 12 Apr 2024

OECD FOS+WOS

1.03.UH PHYSICS, ATOMIC, MOLECULAR & CHEMICAL
1.04.EI CHEMISTRY, PHYSICAL

ID: 61056059