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  1. Atomic Rearrangements and Photoemission Processes at a p-GaN(Cs)–Vacuum Interface

    Bakin, V. V., Kosolobov, S. N., Rozhkov, S. A., Scheibler, H. E. & Terekhov, A. S., 1 Aug 2018, In: JETP Letters. 108, 3, p. 180-184 5 p.

    Research output: Contribution to journal › Article › peer-review

  2. Atomic Processes on the Silicon Surface

    Latyshev, A. V., Fedina, L. I., Kosolobov, S. S., Sitnikov, S. V., Rogilo, D. I., Rodyakina, E. E., Nasimov, D. A., Sheglov, D. V. & Aseev, A. L., 1 Jan 2017, Advances in Semiconductor Nanostructures: Growth, Characterization, Properties and Applications. Latyshev, AV., Dvurechenskii, AV. & Aseev, AL. (eds.). Elsevier Science Publishing Company, Inc., p. 189-221 33 p. (Advances in Semiconductor Nanostructures: Growth, Characterization, Properties and Applications).

    Research output: Chapter in Book/Report/Conference proceeding › Chapter › Research › peer-review

  3. Atomic Force Microscopy Local Oxidation of GeO Thin Films

    Astankova, K. N., Kozhukhov, A. S., Gorokhov, E. B., Azarov, I. A. & Latyshev, A. V., 1 Dec 2018, In: Semiconductors. 52, 16, p. 2081-2084 4 p.

    Research output: Contribution to journal › Article › peer-review

  4. Atomic and electronic structures of the native defects responsible for the resistive effect in HfO2: ab initio simulations

    Perevalov, T. V. & Islamov, D. R., 15 Aug 2019, In: Microelectronic Engineering. 216, 5 p., 111038.

    Research output: Contribution to journal › Article › peer-review

  5. Atomic and Electronic Structures of Intrinsic Defects in Ta2O5: Ab Initio Simulation

    Perevalov, T. V., Islamov, D. R. & Chernykh, I. G., 1 Jun 2018, In: JETP Letters. 107, 12, p. 761-765 5 p.

    Research output: Contribution to journal › Article › peer-review

  6. Atomic and electronic structure of oxygen polyvacancies in ZrO2

    Perevalov, T. V. & Islamov, D. R., 25 Jun 2017, In: Microelectronic Engineering. 178, p. 275-278 4 p.

    Research output: Contribution to journal › Article › peer-review

  7. Asymmetry of anticrossing between atomic steps on metal and semiconductor surfaces

    Khoroshilov, V. S., Kazantsev, D. M., Alperovich, V. L., Coupeau, C. & Drouet, M., 28 Mar 2022, In: Journal of Physics: Conference Series. 2227, 1, 012008.

    Research output: Contribution to journal › Conference article › peer-review

  8. A Study of the Crystal Structure of Co40Fe40B20 Epitaxial Films on a Bi2Te3 Topological Insulator

    Kaveev, A. K., Suturin, S. M., Sokolov, N. S., Kokh, K. A. & Tereshchenko, O. E., 1 Mar 2018, In: Technical Physics Letters. 44, 3, p. 184-186 3 p.

    Research output: Contribution to journal › Article › peer-review

  9. Arrays of Metal Nanostructures for Plasmon-enhanced Spectroscopy

    Milekhin, A. G., Kuznetsov, S. A., Rodyakina, E. E., Anikin, K. V., Milekhin, I. A., Veber, S. L., Latyshev, A. V. & Zahn, D. R. T., 23 Apr 2020, In: Journal of Physics: Conference Series. 1461, 1, 4 p., 012100.

    Research output: Contribution to journal › Conference article › peer-review

  10. Array of dielectric Mie particles with optical surface resonances as a promising coating for thin-film photoelectronic device applications

    Shklyaev, A. A., Utkin, D. E., Tsarev, A. V. & Latyshev, A. V., Mar 2025, In: Vacuum. 233, 113976.

    Research output: Contribution to journal › Article › peer-review

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