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Short-range order and optical properties of thin GeOx films obtained by thermal evaporation of GeO and GeO2. / Hamoud, Ghaithaa; Samus, Alexey; Matsynin, Alexey и др.

в: Thin Solid Films, Том 836, 140869, 15.02.2026.

Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование

Harvard

Hamoud, G, Samus, A, Matsynin, A, Komogortsev, S, Zhandun, V, Prosvirin, I, Astankova, K, Azarov, I, Geydt, P, Milekhin, I & Volodin, V 2026, 'Short-range order and optical properties of thin GeOx films obtained by thermal evaporation of GeO and GeO2', Thin Solid Films, Том. 836, 140869. https://doi.org/10.1016/j.tsf.2026.140869

APA

Hamoud, G., Samus, A., Matsynin, A., Komogortsev, S., Zhandun, V., Prosvirin, I., Astankova, K., Azarov, I., Geydt, P., Milekhin, I., & Volodin, V. (2026). Short-range order and optical properties of thin GeOx films obtained by thermal evaporation of GeO and GeO2. Thin Solid Films, 836, [140869]. https://doi.org/10.1016/j.tsf.2026.140869

Vancouver

Hamoud G, Samus A, Matsynin A, Komogortsev S, Zhandun V, Prosvirin I и др. Short-range order and optical properties of thin GeOx films obtained by thermal evaporation of GeO and GeO2. Thin Solid Films. 2026 февр. 15;836:140869. doi: 10.1016/j.tsf.2026.140869

Author

Hamoud, Ghaithaa ; Samus, Alexey ; Matsynin, Alexey и др. / Short-range order and optical properties of thin GeOx films obtained by thermal evaporation of GeO and GeO2. в: Thin Solid Films. 2026 ; Том 836.

BibTeX

@article{392ef91c20fd47a198d037e9035c1ac0,
title = "Short-range order and optical properties of thin GeOx films obtained by thermal evaporation of GeO and GeO2",
abstract = "A simple method for producing GeOx thin films by thermal evaporation of GeO2, GeO and GeOx targets is proposed. The method does not require high vacuum and electron (or ion) beams or plasma discharge for target evaporation. The atomic structure, optical properties and thicknesses of the obtained GeOx films grown on silicon and glass substrates were studied using a set of methods: X-ray photoelectron spectroscopy, Raman scattering spectroscopy, infrared spectroscopy, transmission and reflection spectroscopies, and spectral ellipsometry. Optical bandgaps (absorption edges) were determined for films grown from different targets.",
keywords = "Germanium oxide, Optical bandgap, Short-range order, Tauc model, Thermal evaporation, Thin film",
author = "Ghaithaa Hamoud and Alexey Samus and Alexey Matsynin and Sergey Komogortsev and Vyacheslav Zhandun and Igor Prosvirin and Ksenia Astankova and Ivan Azarov and Pavel Geydt and Ilya Milekhin and Vladimir Volodin",
note = "The authors acknowledge the «CKP VTAN» of the Novosibirsk State University for conducting measurements on the scientific equipment of the center. The authors acknowledge A.V.Kapishnikov for additional structural characterization. In part of technology development and sample preparation, the work was carried out within the framework of a State Assignment (Federal Research Center KSC Siberian Branch Russian Academy of Sciences). In part of studying the structural and optical properties, the work was carried out within the framework of a State Assignment [ISP SB RAS No. FWGW-2025-0023]. In terms of studying samples using the AFM method, the work was carried out using funds by the Ministry of Science and Higher Education of the Russian Federation, [grant No. {"}FSUS-2024-0020″].",
year = "2026",
month = feb,
day = "15",
doi = "10.1016/j.tsf.2026.140869",
language = "English",
volume = "836",
journal = "Thin Solid Films",
issn = "0040-6090",
publisher = "Elsevier Science Publishing Company, Inc.",

}

RIS

TY - JOUR

T1 - Short-range order and optical properties of thin GeOx films obtained by thermal evaporation of GeO and GeO2

AU - Hamoud, Ghaithaa

AU - Samus, Alexey

AU - Matsynin, Alexey

AU - Komogortsev, Sergey

AU - Zhandun, Vyacheslav

AU - Prosvirin, Igor

AU - Astankova, Ksenia

AU - Azarov, Ivan

AU - Geydt, Pavel

AU - Milekhin, Ilya

AU - Volodin, Vladimir

N1 - The authors acknowledge the «CKP VTAN» of the Novosibirsk State University for conducting measurements on the scientific equipment of the center. The authors acknowledge A.V.Kapishnikov for additional structural characterization. In part of technology development and sample preparation, the work was carried out within the framework of a State Assignment (Federal Research Center KSC Siberian Branch Russian Academy of Sciences). In part of studying the structural and optical properties, the work was carried out within the framework of a State Assignment [ISP SB RAS No. FWGW-2025-0023]. In terms of studying samples using the AFM method, the work was carried out using funds by the Ministry of Science and Higher Education of the Russian Federation, [grant No. "FSUS-2024-0020″].

PY - 2026/2/15

Y1 - 2026/2/15

N2 - A simple method for producing GeOx thin films by thermal evaporation of GeO2, GeO and GeOx targets is proposed. The method does not require high vacuum and electron (or ion) beams or plasma discharge for target evaporation. The atomic structure, optical properties and thicknesses of the obtained GeOx films grown on silicon and glass substrates were studied using a set of methods: X-ray photoelectron spectroscopy, Raman scattering spectroscopy, infrared spectroscopy, transmission and reflection spectroscopies, and spectral ellipsometry. Optical bandgaps (absorption edges) were determined for films grown from different targets.

AB - A simple method for producing GeOx thin films by thermal evaporation of GeO2, GeO and GeOx targets is proposed. The method does not require high vacuum and electron (or ion) beams or plasma discharge for target evaporation. The atomic structure, optical properties and thicknesses of the obtained GeOx films grown on silicon and glass substrates were studied using a set of methods: X-ray photoelectron spectroscopy, Raman scattering spectroscopy, infrared spectroscopy, transmission and reflection spectroscopies, and spectral ellipsometry. Optical bandgaps (absorption edges) were determined for films grown from different targets.

KW - Germanium oxide

KW - Optical bandgap

KW - Short-range order

KW - Tauc model

KW - Thermal evaporation

KW - Thin film

UR - https://www.scopus.com/pages/publications/105034086980

UR - https://www.mendeley.com/catalogue/dd1152f8-84c8-301c-a8e4-b6064caf944f/

U2 - 10.1016/j.tsf.2026.140869

DO - 10.1016/j.tsf.2026.140869

M3 - Article

VL - 836

JO - Thin Solid Films

JF - Thin Solid Films

SN - 0040-6090

M1 - 140869

ER -

ID: 80950227