Standard

Reflection Spectra of Microarrays of Silicon Nanopillars. / Basalaeva, L. S.; Nastaushev, Yu V.; Dultsev, F. N. и др.

в: Optics and Spectroscopy (English translation of Optika i Spektroskopiya), Том 124, № 5, 01.05.2018, стр. 730-734.

Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование

Harvard

Basalaeva, LS, Nastaushev, YV, Dultsev, FN, Kryzhanovskaya, NV & Moiseev, EI 2018, 'Reflection Spectra of Microarrays of Silicon Nanopillars', Optics and Spectroscopy (English translation of Optika i Spektroskopiya), Том. 124, № 5, стр. 730-734. https://doi.org/10.1134/S0030400X1805003X

APA

Basalaeva, L. S., Nastaushev, Y. V., Dultsev, F. N., Kryzhanovskaya, N. V., & Moiseev, E. I. (2018). Reflection Spectra of Microarrays of Silicon Nanopillars. Optics and Spectroscopy (English translation of Optika i Spektroskopiya), 124(5), 730-734. https://doi.org/10.1134/S0030400X1805003X

Vancouver

Basalaeva LS, Nastaushev YV, Dultsev FN, Kryzhanovskaya NV, Moiseev EI. Reflection Spectra of Microarrays of Silicon Nanopillars. Optics and Spectroscopy (English translation of Optika i Spektroskopiya). 2018 май 1;124(5):730-734. doi: 10.1134/S0030400X1805003X

Author

Basalaeva, L. S. ; Nastaushev, Yu V. ; Dultsev, F. N. и др. / Reflection Spectra of Microarrays of Silicon Nanopillars. в: Optics and Spectroscopy (English translation of Optika i Spektroskopiya). 2018 ; Том 124, № 5. стр. 730-734.

BibTeX

@article{50d565cacda0453399d6acb24e28b310,
title = "Reflection Spectra of Microarrays of Silicon Nanopillars",
abstract = "The optical-reflection spectra of microarrays of silicon nanopillars are studied in the visible and near-IR regions. The microarrays of silicon nanopillars are formed by electron-beam lithography and reactive ion etching. The reflection spectra of nanopillar arrays with pitches of 400, 600, 800, and 1000 nm are measured. The height of nanopillars in the array is 0.5 μm, and the diameter varies from 150 to 240 nm. It is noted that the spectral features of the reflection are caused by increased absorption of individual nanopillars and interference effects inside the array. A relation between the geometric parameters of nanopillars and the resonance reflection characteristics is determined taking into account the influence of the substrate.",
keywords = "NANOWIRE ARRAYS, DIFFRACTION, ABSORPTION",
author = "Basalaeva, {L. S.} and Nastaushev, {Yu V.} and Dultsev, {F. N.} and Kryzhanovskaya, {N. V.} and Moiseev, {E. I.}",
year = "2018",
month = may,
day = "1",
doi = "10.1134/S0030400X1805003X",
language = "English",
volume = "124",
pages = "730--734",
journal = "Optics and Spectroscopy (English translation of Optika i Spektroskopiya)",
issn = "0030-400X",
publisher = "Maik Nauka Publishing / Springer SBM",
number = "5",

}

RIS

TY - JOUR

T1 - Reflection Spectra of Microarrays of Silicon Nanopillars

AU - Basalaeva, L. S.

AU - Nastaushev, Yu V.

AU - Dultsev, F. N.

AU - Kryzhanovskaya, N. V.

AU - Moiseev, E. I.

PY - 2018/5/1

Y1 - 2018/5/1

N2 - The optical-reflection spectra of microarrays of silicon nanopillars are studied in the visible and near-IR regions. The microarrays of silicon nanopillars are formed by electron-beam lithography and reactive ion etching. The reflection spectra of nanopillar arrays with pitches of 400, 600, 800, and 1000 nm are measured. The height of nanopillars in the array is 0.5 μm, and the diameter varies from 150 to 240 nm. It is noted that the spectral features of the reflection are caused by increased absorption of individual nanopillars and interference effects inside the array. A relation between the geometric parameters of nanopillars and the resonance reflection characteristics is determined taking into account the influence of the substrate.

AB - The optical-reflection spectra of microarrays of silicon nanopillars are studied in the visible and near-IR regions. The microarrays of silicon nanopillars are formed by electron-beam lithography and reactive ion etching. The reflection spectra of nanopillar arrays with pitches of 400, 600, 800, and 1000 nm are measured. The height of nanopillars in the array is 0.5 μm, and the diameter varies from 150 to 240 nm. It is noted that the spectral features of the reflection are caused by increased absorption of individual nanopillars and interference effects inside the array. A relation between the geometric parameters of nanopillars and the resonance reflection characteristics is determined taking into account the influence of the substrate.

KW - NANOWIRE ARRAYS

KW - DIFFRACTION

KW - ABSORPTION

UR - http://www.scopus.com/inward/record.url?scp=85049236509&partnerID=8YFLogxK

U2 - 10.1134/S0030400X1805003X

DO - 10.1134/S0030400X1805003X

M3 - Article

AN - SCOPUS:85049236509

VL - 124

SP - 730

EP - 734

JO - Optics and Spectroscopy (English translation of Optika i Spektroskopiya)

JF - Optics and Spectroscopy (English translation of Optika i Spektroskopiya)

SN - 0030-400X

IS - 5

ER -

ID: 14316727