Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
Micro-ellipsometry of square lattices of plasmonic nanodiscs on dielectric substrates and in metal-insulator-metal configurations. / Bortchagovsky, E.; Simo, C ; Milekhin, Ilya и др.
в: Micro and Nano Engineering, Том 18, 100172, 04.2023.Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
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TY - JOUR
T1 - Micro-ellipsometry of square lattices of plasmonic nanodiscs on dielectric substrates and in metal-insulator-metal configurations
AU - Bortchagovsky, E.
AU - Simo, C
AU - Milekhin, Ilya
AU - Tang, J
AU - Zahn, Dietrich R.T.
AU - Fleischer, M.
N1 - Acknowledgements: This work was performed in the frame of the bilateral DFG (Germany) [grants no. ZA 146/43-1 and no. FL 670/8-1] – NRFU (Ukraine) [grant no. Ф81/41842] project “Microellipsometric investigation of ordered plasmonic nanostructures”.
PY - 2023/4
Y1 - 2023/4
N2 - This article demonstrates the capability of imaging micro-ellipsometry in the investigation of ordered plasmonic nanostructures on different substrates. The difference of the resonances of similar square lattices of plasmonic nanoparticles on a dielectric substrate and in a metal-insulator-metal configuration is analyzed. The influence of the surface plasmon on interparticle interactions becomes clearly apparent. Comparison of the obtained data with dark-field scattering spectra proves the consistency of the measured results as well as the complementary information received from both methods.
AB - This article demonstrates the capability of imaging micro-ellipsometry in the investigation of ordered plasmonic nanostructures on different substrates. The difference of the resonances of similar square lattices of plasmonic nanoparticles on a dielectric substrate and in a metal-insulator-metal configuration is analyzed. The influence of the surface plasmon on interparticle interactions becomes clearly apparent. Comparison of the obtained data with dark-field scattering spectra proves the consistency of the measured results as well as the complementary information received from both methods.
UR - https://www.mendeley.com/catalogue/e68fafcd-303d-38aa-b416-5dd3f3440b40/
U2 - 10.1016/j.mne.2023.100172
DO - 10.1016/j.mne.2023.100172
M3 - Article
VL - 18
JO - Micro and Nano Engineering
JF - Micro and Nano Engineering
SN - 2590-0072
M1 - 100172
ER -
ID: 43522637