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Micro-ellipsometry of square lattices of plasmonic nanodiscs on dielectric substrates and in metal-insulator-metal configurations. / Bortchagovsky, E.; Simo, C ; Milekhin, Ilya и др.

в: Micro and Nano Engineering, Том 18, 100172, 04.2023.

Результаты исследований: Научные публикации в периодических изданияхстатьяРецензирование

Harvard

APA

Bortchagovsky, E., Simo, C., Milekhin, I., Tang, J., Zahn, D. R. T., & Fleischer, M. (2023). Micro-ellipsometry of square lattices of plasmonic nanodiscs on dielectric substrates and in metal-insulator-metal configurations. Micro and Nano Engineering, 18, [100172]. https://doi.org/10.1016/j.mne.2023.100172

Vancouver

Bortchagovsky E, Simo C, Milekhin I, Tang J, Zahn DRT, Fleischer M. Micro-ellipsometry of square lattices of plasmonic nanodiscs on dielectric substrates and in metal-insulator-metal configurations. Micro and Nano Engineering. 2023 апр.;18:100172. doi: 10.1016/j.mne.2023.100172

Author

BibTeX

@article{eeac1c3b420145979cec63c3ac3c8c67,
title = "Micro-ellipsometry of square lattices of plasmonic nanodiscs on dielectric substrates and in metal-insulator-metal configurations",
abstract = "This article demonstrates the capability of imaging micro-ellipsometry in the investigation of ordered plasmonic nanostructures on different substrates. The difference of the resonances of similar square lattices of plasmonic nanoparticles on a dielectric substrate and in a metal-insulator-metal configuration is analyzed. The influence of the surface plasmon on interparticle interactions becomes clearly apparent. Comparison of the obtained data with dark-field scattering spectra proves the consistency of the measured results as well as the complementary information received from both methods.",
author = "E. Bortchagovsky and C Simo and Ilya Milekhin and J Tang and Zahn, {Dietrich R.T.} and M. Fleischer",
note = "Acknowledgements: This work was performed in the frame of the bilateral DFG (Germany) [grants no. ZA 146/43-1 and no. FL 670/8-1] – NRFU (Ukraine) [grant no. Ф81/41842] project “Microellipsometric investigation of ordered plasmonic nanostructures”.",
year = "2023",
month = apr,
doi = "10.1016/j.mne.2023.100172",
language = "English",
volume = "18",
journal = "Micro and Nano Engineering",
issn = "2590-0072",
publisher = "Elsevier",

}

RIS

TY - JOUR

T1 - Micro-ellipsometry of square lattices of plasmonic nanodiscs on dielectric substrates and in metal-insulator-metal configurations

AU - Bortchagovsky, E.

AU - Simo, C

AU - Milekhin, Ilya

AU - Tang, J

AU - Zahn, Dietrich R.T.

AU - Fleischer, M.

N1 - Acknowledgements: This work was performed in the frame of the bilateral DFG (Germany) [grants no. ZA 146/43-1 and no. FL 670/8-1] – NRFU (Ukraine) [grant no. Ф81/41842] project “Microellipsometric investigation of ordered plasmonic nanostructures”.

PY - 2023/4

Y1 - 2023/4

N2 - This article demonstrates the capability of imaging micro-ellipsometry in the investigation of ordered plasmonic nanostructures on different substrates. The difference of the resonances of similar square lattices of plasmonic nanoparticles on a dielectric substrate and in a metal-insulator-metal configuration is analyzed. The influence of the surface plasmon on interparticle interactions becomes clearly apparent. Comparison of the obtained data with dark-field scattering spectra proves the consistency of the measured results as well as the complementary information received from both methods.

AB - This article demonstrates the capability of imaging micro-ellipsometry in the investigation of ordered plasmonic nanostructures on different substrates. The difference of the resonances of similar square lattices of plasmonic nanoparticles on a dielectric substrate and in a metal-insulator-metal configuration is analyzed. The influence of the surface plasmon on interparticle interactions becomes clearly apparent. Comparison of the obtained data with dark-field scattering spectra proves the consistency of the measured results as well as the complementary information received from both methods.

UR - https://www.mendeley.com/catalogue/e68fafcd-303d-38aa-b416-5dd3f3440b40/

U2 - 10.1016/j.mne.2023.100172

DO - 10.1016/j.mne.2023.100172

M3 - Article

VL - 18

JO - Micro and Nano Engineering

JF - Micro and Nano Engineering

SN - 2590-0072

M1 - 100172

ER -

ID: 43522637