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Light-emitting defects formed in GeO/SiO2 heterostructures with assistance of swift heavy ions. / Cherkova, S. G.; Volodin, V. A.; Skuratov, V. A. и др.
в: Journal of Luminescence, Том 207, 01.03.2019, стр. 209-212.Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
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TY - JOUR
T1 - Light-emitting defects formed in GeO/SiO2 heterostructures with assistance of swift heavy ions
AU - Cherkova, S. G.
AU - Volodin, V. A.
AU - Skuratov, V. A.
AU - Stoffel, M.
AU - Rinnert, H.
AU - Vergnat, M.
PY - 2019/3/1
Y1 - 2019/3/1
N2 - Germanium suboxide films and GeO/SiO2 multilayer heterostructures deposited onto Si(001) substrates using evaporation in high vacuum were modified using irradiation of 167 MeV Xe+26 ions with fluences varying from 1011 to 1013 cm−2. According to Raman spectroscopy data, the swift heavy ion irradiation does not lead to the expected decomposition of germanium suboxide in germanium nanoclusters and GeO2. Infrared absorption spectroscopy measurements show that under irradiation the GeO/SiO2 layers were intermixed with formation of Ge-O-Si bonds. We report strong photoluminescence in the visible range at room temperature, which is most probably due to Ge-related defect-induced radiative transitions. Moreover, a new infrared luminescence band (~0.8 eV) was observed in irradiated structures, which can be related to defects or defects complexes in GexSiyO2 glass.
AB - Germanium suboxide films and GeO/SiO2 multilayer heterostructures deposited onto Si(001) substrates using evaporation in high vacuum were modified using irradiation of 167 MeV Xe+26 ions with fluences varying from 1011 to 1013 cm−2. According to Raman spectroscopy data, the swift heavy ion irradiation does not lead to the expected decomposition of germanium suboxide in germanium nanoclusters and GeO2. Infrared absorption spectroscopy measurements show that under irradiation the GeO/SiO2 layers were intermixed with formation of Ge-O-Si bonds. We report strong photoluminescence in the visible range at room temperature, which is most probably due to Ge-related defect-induced radiative transitions. Moreover, a new infrared luminescence band (~0.8 eV) was observed in irradiated structures, which can be related to defects or defects complexes in GexSiyO2 glass.
KW - Defects
KW - Ge oxides
KW - GeSiO glasses
KW - Luminescence
KW - Swift heavy ions
KW - OPTICAL-PROPERTIES
KW - VISIBLE PHOTOLUMINESCENCE
KW - GE NANOCRYSTALS
KW - RADIATION
KW - IRRADIATION
KW - QUANTUM-CONFINEMENT
KW - Ge(x)Si(y)O(2 )glasses
KW - GERMANIUM OXIDES
UR - http://www.scopus.com/inward/record.url?scp=85056908683&partnerID=8YFLogxK
U2 - 10.1016/j.jlumin.2018.11.028
DO - 10.1016/j.jlumin.2018.11.028
M3 - Article
AN - SCOPUS:85056908683
VL - 207
SP - 209
EP - 212
JO - Journal of Luminescence
JF - Journal of Luminescence
SN - 0022-2313
ER -
ID: 18069187