Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
Features of MIS Structures Based on Insulating PbSnTe:In Films with the Composition in the Vicinity of the Band Inversion Related to Their Ferroelectric Properties. / Klimov, A. E.; Akimov, A. N.; Akhundov, I. O. и др.
в: Semiconductors, Том 54, № 10, 01.10.2020, стр. 1325-1331.Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
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TY - JOUR
T1 - Features of MIS Structures Based on Insulating PbSnTe:In Films with the Composition in the Vicinity of the Band Inversion Related to Their Ferroelectric Properties
AU - Klimov, A. E.
AU - Akimov, A. N.
AU - Akhundov, I. O.
AU - Golyashov, V. A.
AU - Gorshkov, D. V.
AU - Ishchenko, D. V.
AU - Matyushenko, E. V.
AU - Neizvestny, I. G.
AU - Sidorov, G. Yu
AU - Suprun, S. P.
AU - Tarasov, A. S.
AU - Tereshchenko, O. E.
AU - Epov, V. S.
PY - 2020/10/1
Y1 - 2020/10/1
N2 - The characteristics of metal-insulator-semiconductor (MIS) structures based on insulating PbSnTe:In films with compositions in the vicinity of band inversion grown by molecular-beam epitaxy (MBE) are studied. It is shown that a number of features of the films can be due to a ferroelectric phase transition with a Curie temperature in the range of about T ≈ 15–20 K.
AB - The characteristics of metal-insulator-semiconductor (MIS) structures based on insulating PbSnTe:In films with compositions in the vicinity of band inversion grown by molecular-beam epitaxy (MBE) are studied. It is shown that a number of features of the films can be due to a ferroelectric phase transition with a Curie temperature in the range of about T ≈ 15–20 K.
KW - ferroelectric phase transition
KW - field effect
KW - MIS structure
KW - PbSnTe:In solid solution
KW - SOLID-SOLUTIONS
KW - PbSnTe
KW - In solid solution
UR - http://www.scopus.com/inward/record.url?scp=85092354413&partnerID=8YFLogxK
U2 - 10.1134/S1063782620100164
DO - 10.1134/S1063782620100164
M3 - Article
AN - SCOPUS:85092354413
VL - 54
SP - 1325
EP - 1331
JO - Semiconductors
JF - Semiconductors
SN - 1063-7826
IS - 10
ER -
ID: 25675814