Chemical Composition Dependent Raman Scattering Spectroscopy of MBE Grown Manganese - Based Bismuth Telluride Topological Insulator Thin Films

Язык оригинала	английский
Журнал	Journal of Raman Spectroscopy
DOI	https://doi.org/10.1002/jrs.6779
Состояние	Опубликовано - 13 февр. 2025

magnetic topological insulators, molecular beam epitaxy, polarization-resolved resonant Raman spectroscopy, vibrational modes

ID: 64823272