Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
Charge Transport Mechanism and Trap Origin in Methyl-Terminated Organosilicate Glass Low-κ Dielectrics. / Perevalov, Timofey V.; Gismatulin, Andrei A.; Dolbak, Andrei E. и др.
в: Physica Status Solidi (A) Applications and Materials Science, Том 218, № 4, 2000654, 02.2021.Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
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TY - JOUR
T1 - Charge Transport Mechanism and Trap Origin in Methyl-Terminated Organosilicate Glass Low-κ Dielectrics
AU - Perevalov, Timofey V.
AU - Gismatulin, Andrei A.
AU - Dolbak, Andrei E.
AU - Gritsenko, Vladimir A.
AU - Trofimova, Elena S.
AU - Pustovarov, Vladimir A.
AU - Seregin, Dmitry S.
AU - Vorotilov, Konstantin A.
AU - Baklanov, Mikhail R.
N1 - Funding Information: Experiments and simulation were conducted under the grant of the Russian Foundation for Basic Research (RFBR) (project No. 18‐29‐27006). The low‐κ program conceptualization and selection of the material for this research were conducted under the grant RFBR No. 18‐29‐27022. The recipe development and deposition were conducted under the Ministry of Science and Higher Education of Russia (Nos. FSFZ‐2020‐0022, FEUZ‐2020‐0060, 0306‐2019‐0005). The authors are grateful to the Analytical and Technological Research Center “High Technology and Nanostructured Materials” of NSU. The ab initio computations were carried out at the Novosibirsk State University Supercomputer Center. Publisher Copyright: © 2020 Wiley-VCH GmbH Copyright: Copyright 2020 Elsevier B.V., All rights reserved.
PY - 2021/2
Y1 - 2021/2
N2 - The charge transport and trap nature responsible for the leakage current through thermally cured methyl-terminated organosilicate low-κ dielectric films are studied. It is found that the Frenkel emission does not describe correctly the charge transport in the studied films. The charge transport occurs via the phonon-assisted electron tunneling between neutral traps as described in the Nasyrov–Gritsenko model. The obtained thermal trap energy value 1.2 eV is close to that for the oxygen divacancy (Si-Si-Si cluster) in SiO2. The electron energy loss spectra, photoluminescence excitation of 2.7 eV blue band spectra, and data from the simulation within the density functional theory for the model SiCOH low-κ structure confirm the presence of oxygen vacancy and divacancy in the studied films. The thermal trap energy value estimated as half the Stokes shift of the blue luminescence also gives a value close to 1.2 eV. It proves the correctness of the Nasyrov–Gritsenko model for describing the charge transport mechanism and the conclusion that oxygen divacancies are traps responsible for the leakage current in the studied low-κ films.
AB - The charge transport and trap nature responsible for the leakage current through thermally cured methyl-terminated organosilicate low-κ dielectric films are studied. It is found that the Frenkel emission does not describe correctly the charge transport in the studied films. The charge transport occurs via the phonon-assisted electron tunneling between neutral traps as described in the Nasyrov–Gritsenko model. The obtained thermal trap energy value 1.2 eV is close to that for the oxygen divacancy (Si-Si-Si cluster) in SiO2. The electron energy loss spectra, photoluminescence excitation of 2.7 eV blue band spectra, and data from the simulation within the density functional theory for the model SiCOH low-κ structure confirm the presence of oxygen vacancy and divacancy in the studied films. The thermal trap energy value estimated as half the Stokes shift of the blue luminescence also gives a value close to 1.2 eV. It proves the correctness of the Nasyrov–Gritsenko model for describing the charge transport mechanism and the conclusion that oxygen divacancies are traps responsible for the leakage current in the studied low-κ films.
KW - charge transport
KW - density functional theory simulations
KW - low-κ dielectrics
KW - photoluminescence
KW - trap energy
KW - dielectrics
KW - OXYGEN-DEFICIENT CENTERS
KW - DEFECTS
KW - OPTICAL-PROPERTIES
KW - MODEL
KW - DAMAGE
KW - INTERLEVEL
KW - FILMS
KW - LUMINESCENCE
KW - LOW-K DIELECTRICS
KW - CONDUCTION
KW - low-κ
UR - http://www.scopus.com/inward/record.url?scp=85097816348&partnerID=8YFLogxK
U2 - 10.1002/pssa.202000654
DO - 10.1002/pssa.202000654
M3 - Article
AN - SCOPUS:85097816348
VL - 218
JO - Physica Status Solidi (A) Applications and Materials Science
JF - Physica Status Solidi (A) Applications and Materials Science
SN - 1862-6300
IS - 4
M1 - 2000654
ER -
ID: 27117671