Standard

Thin Layer Method for LA-ICP-MS Analysis of Trace Elements Concentrates of Germanium Dioxide. / Medvedev, Nickolay S.; Kurbatova, Valeriya D.; Guselnikova, Tatiana Ya et al.

In: Atomic Spectroscopy, Vol. 45, No. 1, 2024, p. 26-32.

Research output: Contribution to journal › Article › peer-review

Harvard

Medvedev, NS, Kurbatova, VD, Guselnikova, TY & Saprykin, AI 2024, 'Thin Layer Method for LA-ICP-MS Analysis of Trace Elements Concentrates of Germanium Dioxide', Atomic Spectroscopy, vol. 45, no. 1, pp. 26-32. https://doi.org/10.46770/AS.2023.256

APA

Medvedev, N. S., Kurbatova, V. D., Guselnikova, T. Y., & Saprykin, A. I. (2024). Thin Layer Method for LA-ICP-MS Analysis of Trace Elements Concentrates of Germanium Dioxide. Atomic Spectroscopy, 45(1), 26-32. https://doi.org/10.46770/AS.2023.256

Vancouver

Medvedev NS, Kurbatova VD, Guselnikova TY, Saprykin AI. Thin Layer Method for LA-ICP-MS Analysis of Trace Elements Concentrates of Germanium Dioxide. Atomic Spectroscopy. 2024;45(1):26-32. doi: 10.46770/AS.2023.256

Author

Medvedev, Nickolay S. ; Kurbatova, Valeriya D. ; Guselnikova, Tatiana Ya et al. / Thin Layer Method for LA-ICP-MS Analysis of Trace Elements Concentrates of Germanium Dioxide. In: Atomic Spectroscopy. 2024 ; Vol. 45, No. 1. pp. 26-32.

BibTeX

@article{544ce416c2c049b2b47e3ddd841cca20,
title = "Thin Layer Method for LA-ICP-MS Analysis of Trace Elements Concentrates of Germanium Dioxide",
abstract = "A combination of trace elements preconcentration and laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS) is proposed for the analysis of high purity substances. The analytical figures of merit of this combination were evaluated using high purity germanium dioxide as an example. Trace elements were preconcentrated by germanium volatization in the form of germanium tetrachloride from sample solutions. The trace elements concentrate was evaporated to dryness on the surface of a high-purity silicon substrate and analyzed by LA-ICP-MS. Indium was used as an internal standard to obtain quantitative data. Limits of detection (LODs) for 47 trace elements are in the range from 0.3 to 300 ppt wt (0.3 to 300 pg g-1). The obtained LODs are 10-100 times lower compared to ICP-MS analysis of germanium with preconcentration of trace elements. The accuracy of results was confirmed by comparing with results obtained by the traditional ICP-MS analysis of the trace elements concentrates and by the “spike” experiments.",
author = "Medvedev, {Nickolay S.} and Kurbatova, {Valeriya D.} and Guselnikova, {Tatiana Ya} and Saprykin, {Anatoly I.}",
note = "The authors gratefully thank the Ministry of Science and Higher Education of the Russian Federation, project No. 121031700315-2 for financial support of this work.",
year = "2024",
doi = "10.46770/AS.2023.256",
language = "English",
volume = "45",
pages = "26--32",
journal = "Atomic Spectroscopy",
issn = "0195-5373",
publisher = "Atomic Spectroscopy Press Limited",
number = "1",

}

RIS

TY - JOUR

T1 - Thin Layer Method for LA-ICP-MS Analysis of Trace Elements Concentrates of Germanium Dioxide

AU - Medvedev, Nickolay S.

AU - Kurbatova, Valeriya D.

AU - Guselnikova, Tatiana Ya

AU - Saprykin, Anatoly I.

N1 - The authors gratefully thank the Ministry of Science and Higher Education of the Russian Federation, project No. 121031700315-2 for financial support of this work.

PY - 2024

Y1 - 2024

N2 - A combination of trace elements preconcentration and laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS) is proposed for the analysis of high purity substances. The analytical figures of merit of this combination were evaluated using high purity germanium dioxide as an example. Trace elements were preconcentrated by germanium volatization in the form of germanium tetrachloride from sample solutions. The trace elements concentrate was evaporated to dryness on the surface of a high-purity silicon substrate and analyzed by LA-ICP-MS. Indium was used as an internal standard to obtain quantitative data. Limits of detection (LODs) for 47 trace elements are in the range from 0.3 to 300 ppt wt (0.3 to 300 pg g-1). The obtained LODs are 10-100 times lower compared to ICP-MS analysis of germanium with preconcentration of trace elements. The accuracy of results was confirmed by comparing with results obtained by the traditional ICP-MS analysis of the trace elements concentrates and by the “spike” experiments.

AB - A combination of trace elements preconcentration and laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS) is proposed for the analysis of high purity substances. The analytical figures of merit of this combination were evaluated using high purity germanium dioxide as an example. Trace elements were preconcentrated by germanium volatization in the form of germanium tetrachloride from sample solutions. The trace elements concentrate was evaporated to dryness on the surface of a high-purity silicon substrate and analyzed by LA-ICP-MS. Indium was used as an internal standard to obtain quantitative data. Limits of detection (LODs) for 47 trace elements are in the range from 0.3 to 300 ppt wt (0.3 to 300 pg g-1). The obtained LODs are 10-100 times lower compared to ICP-MS analysis of germanium with preconcentration of trace elements. The accuracy of results was confirmed by comparing with results obtained by the traditional ICP-MS analysis of the trace elements concentrates and by the “spike” experiments.

UR - https://www.scopus.com/record/display.uri?eid=2-s2.0-85188453782&origin=inward&txGid=bfd8718c89cac3e7b4d603ca89890f19

UR - https://www.mendeley.com/catalogue/271dbad9-021f-3500-9ef1-b17a4fec4097/

U2 - 10.46770/AS.2023.256

DO - 10.46770/AS.2023.256

M3 - Article

VL - 45

SP - 26

EP - 32

JO - Atomic Spectroscopy

JF - Atomic Spectroscopy

SN - 0195-5373

IS - 1

ER -

ID: 60479170