Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
Thin Layer Method for LA-ICP-MS Analysis of Trace Elements Concentrates of Germanium Dioxide. / Medvedev, Nickolay S.; Kurbatova, Valeriya D.; Guselnikova, Tatiana Ya и др.
в: Atomic Spectroscopy, Том 45, № 1, 2024, стр. 26-32.Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
}
TY - JOUR
T1 - Thin Layer Method for LA-ICP-MS Analysis of Trace Elements Concentrates of Germanium Dioxide
AU - Medvedev, Nickolay S.
AU - Kurbatova, Valeriya D.
AU - Guselnikova, Tatiana Ya
AU - Saprykin, Anatoly I.
N1 - The authors gratefully thank the Ministry of Science and Higher Education of the Russian Federation, project No. 121031700315-2 for financial support of this work.
PY - 2024
Y1 - 2024
N2 - A combination of trace elements preconcentration and laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS) is proposed for the analysis of high purity substances. The analytical figures of merit of this combination were evaluated using high purity germanium dioxide as an example. Trace elements were preconcentrated by germanium volatization in the form of germanium tetrachloride from sample solutions. The trace elements concentrate was evaporated to dryness on the surface of a high-purity silicon substrate and analyzed by LA-ICP-MS. Indium was used as an internal standard to obtain quantitative data. Limits of detection (LODs) for 47 trace elements are in the range from 0.3 to 300 ppt wt (0.3 to 300 pg g-1). The obtained LODs are 10-100 times lower compared to ICP-MS analysis of germanium with preconcentration of trace elements. The accuracy of results was confirmed by comparing with results obtained by the traditional ICP-MS analysis of the trace elements concentrates and by the “spike” experiments.
AB - A combination of trace elements preconcentration and laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS) is proposed for the analysis of high purity substances. The analytical figures of merit of this combination were evaluated using high purity germanium dioxide as an example. Trace elements were preconcentrated by germanium volatization in the form of germanium tetrachloride from sample solutions. The trace elements concentrate was evaporated to dryness on the surface of a high-purity silicon substrate and analyzed by LA-ICP-MS. Indium was used as an internal standard to obtain quantitative data. Limits of detection (LODs) for 47 trace elements are in the range from 0.3 to 300 ppt wt (0.3 to 300 pg g-1). The obtained LODs are 10-100 times lower compared to ICP-MS analysis of germanium with preconcentration of trace elements. The accuracy of results was confirmed by comparing with results obtained by the traditional ICP-MS analysis of the trace elements concentrates and by the “spike” experiments.
UR - https://www.scopus.com/record/display.uri?eid=2-s2.0-85188453782&origin=inward&txGid=bfd8718c89cac3e7b4d603ca89890f19
UR - https://www.mendeley.com/catalogue/271dbad9-021f-3500-9ef1-b17a4fec4097/
U2 - 10.46770/AS.2023.256
DO - 10.46770/AS.2023.256
M3 - Article
VL - 45
SP - 26
EP - 32
JO - Atomic Spectroscopy
JF - Atomic Spectroscopy
SN - 0195-5373
IS - 1
ER -
ID: 60479170