Thin Layer Method for LA-ICP-MS Analysis of Trace Elements Concentrates of Germanium Dioxide › Research Explorer

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Thin Layer Method for LA-ICP-MS Analysis of Trace Elements Concentrates of Germanium Dioxide

Research output: Contribution to journal › Article › peer-review

DOI

https://doi.org/10.46770/AS.2023.256
Final published version

Nickolay S. Medvedev
Valeriya D. Kurbatova
Tatiana Ya Guselnikova
Anatoly I. Saprykin

Original language	English
Pages (from-to)	26-32
Number of pages	7
Journal	Atomic Spectroscopy
Volume	45
Issue number	1
DOIs	https://doi.org/10.46770/AS.2023.256
Publication status	Published - 2024

OECD FOS+WOS

2.11.XQ SPECTROSCOPY

ID: 60479170