The use of 2D diffractometry data for oriented samples in the choice of a unit cell

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The use of 2D diffractometry data for oriented samples in the choice of a unit cell. / Sukhikh, A. S.; Basova, T. V.; Gromilov, S. A.

In: Journal of Structural Chemistry, Vol. 58, No. 5, 01.09.2017, p. 953-963.

Research output: Contribution to journal › Article › peer-review

BibTeX

@article{bb0e63ec885a477483d9471f0c25be59,

title = "The use of 2D diffractometry data for oriented samples in the choice of a unit cell",

abstract = "An approach for the substantiated choice of the indexing procedure of a diffraction pattern is described. The technique is based on a combined use of powder X-ray diffraction data in Bragg–Brentano schemes and 2D GIXD of mainly oriented polycrystalline samples.",

keywords = "indexing, oriented samples, palladium phthalocyanines, thin films, X-ray diffractometry of polycrystals",

author = "Sukhikh, {A. S.} and Basova, {T. V.} and Gromilov, {S. A.}",

note = "Publisher Copyright: {\textcopyright} 2017, Pleiades Publishing, Ltd.",

year = "2017",

month = sep,

day = "1",

doi = "10.1134/S0022476617050146",

language = "English",

volume = "58",

pages = "953--963",

journal = "Journal of Structural Chemistry",

issn = "0022-4766",

publisher = "Springer GmbH & Co, Auslieferungs-Gesellschaf",

number = "5",

}

RIS

TY - JOUR

T1 - The use of 2D diffractometry data for oriented samples in the choice of a unit cell

AU - Sukhikh, A. S.

AU - Basova, T. V.

AU - Gromilov, S. A.

PY - 2017/9/1

Y1 - 2017/9/1

N2 - An approach for the substantiated choice of the indexing procedure of a diffraction pattern is described. The technique is based on a combined use of powder X-ray diffraction data in Bragg–Brentano schemes and 2D GIXD of mainly oriented polycrystalline samples.

AB - An approach for the substantiated choice of the indexing procedure of a diffraction pattern is described. The technique is based on a combined use of powder X-ray diffraction data in Bragg–Brentano schemes and 2D GIXD of mainly oriented polycrystalline samples.

KW - indexing

KW - oriented samples

KW - palladium phthalocyanines

KW - thin films

KW - X-ray diffractometry of polycrystals

UR - http://www.scopus.com/inward/record.url?scp=85032273791&partnerID=8YFLogxK

U2 - 10.1134/S0022476617050146

DO - 10.1134/S0022476617050146

M3 - Article

AN - SCOPUS:85032273791

VL - 58

SP - 953

EP - 963

JO - Journal of Structural Chemistry

JF - Journal of Structural Chemistry

SN - 0022-4766

IS - 5

ER -

ID: 9873785