DOI

  • V. V. Rumyantsev
  • D. V. Kozlov
  • S. V. Morozov
  • M. A. Fadeev
  • A. M. Kadykov
  • F. Teppe
  • V. S. Varavin
  • M. V. Yakushev
  • N. N. Mikhailov
  • S. A. Dvoretskii
  • V. I. Gavrilenko
Original languageEnglish
Article number095007
Number of pages9
JournalSemiconductor Science and Technology
Volume32
Issue number9
DOIs
Publication statusPublished - 16 Aug 2017

    Research areas

  • annealing, double acceptors, Fourier transform infrared spectroscopy, HgCdTe, Luttinger-Kohn model, STATES, CYCLOTRON-RESONANCE, DEEP LEVELS, HG1-XCDXTE, HETEROSTRUCTURES, ELECTRICAL-PROPERTIES, IMPURITY, HGTE QUANTUM-WELLS, SPECTROSCOPY, SPECTRA

    OECD FOS+WOS

ID: 9915519