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Surface Polaritons in Silicon-Doped Aluminum and Gallium Nitride Films. / Novikova, N. N.; Yakovlev, V. A.; Klimin, S. A. et al.

In: Optics and Spectroscopy, Vol. 127, No. 1, 01.07.2019, p. 36-39.

Research output: Contribution to journal › Article › peer-review

Harvard

Novikova, NN, Yakovlev, VA, Klimin, SA, Malin, TV, Gilinsky, AM & Zhuravlev, KS 2019, 'Surface Polaritons in Silicon-Doped Aluminum and Gallium Nitride Films', Optics and Spectroscopy, vol. 127, no. 1, pp. 36-39. https://doi.org/10.1134/S0030400X19070208

APA

Novikova, N. N., Yakovlev, V. A., Klimin, S. A., Malin, T. V., Gilinsky, A. M., & Zhuravlev, K. S. (2019). Surface Polaritons in Silicon-Doped Aluminum and Gallium Nitride Films. Optics and Spectroscopy, 127(1), 36-39. https://doi.org/10.1134/S0030400X19070208

Vancouver

Novikova NN, Yakovlev VA, Klimin SA, Malin TV, Gilinsky AM, Zhuravlev KS. Surface Polaritons in Silicon-Doped Aluminum and Gallium Nitride Films. Optics and Spectroscopy. 2019 Jul 1;127(1):36-39. doi: 10.1134/S0030400X19070208

Author

Novikova, N. N. ; Yakovlev, V. A. ; Klimin, S. A. et al. / Surface Polaritons in Silicon-Doped Aluminum and Gallium Nitride Films. In: Optics and Spectroscopy. 2019 ; Vol. 127, No. 1. pp. 36-39.

BibTeX

@article{32aec2e9139b4711ab93aae0ff0ce4eb,
title = "Surface Polaritons in Silicon-Doped Aluminum and Gallium Nitride Films",
abstract = "Abstract: The reflection and attenuated total reflection spectra of aluminum and gallium nitride films doped with silicon on sapphire substrates with a buffer layer of aluminum nitride have been measured. In the spectra of attenuated total reflection, surface phonon and plasmon–phonon polaritons were observed. A high concentration of charge carriers in the gallium nitride film and their practical absence in the aluminum nitride film were experimentally observed.",
keywords = "aluminum and gallium nitrides, reflection and ATR spectroscopy, surface polaritons, VIBRATIONS",
author = "Novikova, {N. N.} and Yakovlev, {V. A.} and Klimin, {S. A.} and Malin, {T. V.} and Gilinsky, {A. M.} and Zhuravlev, {K. S.}",
year = "2019",
month = jul,
day = "1",
doi = "10.1134/S0030400X19070208",
language = "English",
volume = "127",
pages = "36--39",
journal = "Optics and Spectroscopy (English translation of Optika i Spektroskopiya)",
issn = "0030-400X",
publisher = "Maik Nauka Publishing / Springer SBM",
number = "1",

}

RIS

TY - JOUR

T1 - Surface Polaritons in Silicon-Doped Aluminum and Gallium Nitride Films

AU - Novikova, N. N.

AU - Yakovlev, V. A.

AU - Klimin, S. A.

AU - Malin, T. V.

AU - Gilinsky, A. M.

AU - Zhuravlev, K. S.

PY - 2019/7/1

Y1 - 2019/7/1

N2 - Abstract: The reflection and attenuated total reflection spectra of aluminum and gallium nitride films doped with silicon on sapphire substrates with a buffer layer of aluminum nitride have been measured. In the spectra of attenuated total reflection, surface phonon and plasmon–phonon polaritons were observed. A high concentration of charge carriers in the gallium nitride film and their practical absence in the aluminum nitride film were experimentally observed.

AB - Abstract: The reflection and attenuated total reflection spectra of aluminum and gallium nitride films doped with silicon on sapphire substrates with a buffer layer of aluminum nitride have been measured. In the spectra of attenuated total reflection, surface phonon and plasmon–phonon polaritons were observed. A high concentration of charge carriers in the gallium nitride film and their practical absence in the aluminum nitride film were experimentally observed.

KW - aluminum and gallium nitrides

KW - reflection and ATR spectroscopy

KW - surface polaritons

KW - VIBRATIONS

UR - http://www.scopus.com/inward/record.url?scp=85070857427&partnerID=8YFLogxK

U2 - 10.1134/S0030400X19070208

DO - 10.1134/S0030400X19070208

M3 - Article

AN - SCOPUS:85070857427

VL - 127

SP - 36

EP - 39

JO - Optics and Spectroscopy (English translation of Optika i Spektroskopiya)

JF - Optics and Spectroscopy (English translation of Optika i Spektroskopiya)

SN - 0030-400X

IS - 1

ER -

ID: 21346837